STUDY OF PASSIVE OXIDE FILMS ON METALS USING INFRARED SPECTROSCOPY (original) (raw)

This study investigates the formation and characteristics of anodic oxide films on valve metals including aluminum (Al), tantalum (Ta), and zirconium (Zr) using synchrotron-based infrared microspectroscopy. The research focuses on the growth kinetics and structural attributes of these oxide films, particularly under varying current densities and solution compositions. Measurements reveal significant vibrational characteristics of the Al-O and Ta-O bonds, indicating structural changes in the oxide films as potential increases.