Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy (original) (raw)

Journal of Electronic Materials, 2010

Abstract

... PLETSCHEN,1 WOLFGANG BRONNER,1 RU¨ DIGER QUAY,1 PATRICK WALTEREIT,1 MICHAEL MIKULLA,1 OLIVER AMBACHER,1 FRANCK BOURGEOIS,2 ... 1. A small band of enhanced EL intensity (ELI) and a bright spot were observed along the drain side of one of the ...

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