Performance of different readout topologies of silicon drift detectors in PIXE spectroscopy (original) (raw)

2008 IEEE Nuclear Science Symposium Conference Record, 2008

Abstract

PIXE (Particle Induced X-ray Emission) is a very powerful technique for the detection of medium-light elements (down to Z=11 − Na) due to its superior cross-sections in this atomic number region. However, a common problem in all PIXE setups is the backscattering of protons from the target that perturbs the electronic system, causing front-end electronics saturation, increasing the dead-time and

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