Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy (original) (raw)

Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy

Microscopy and Microanalysis, 2006

Abstract

Abstract Advances in Instrumentation and Techniques-Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel ...

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