Femtosecond laser damage and ablation of dielectrics: determinism, selectivity, and nanometric resolution (original) (raw)

Laser-Induced Damage in Optical Materials: 2010, 2010

Abstract

We present a coupled study of laser-induced damage and ablation of fused silica in the femtosecond regime. Both thresholds are essentially different and investigations under a wide excursion of pulse duration (< 10 fs to 300 fs) and applied fluence (Fth < F < 10 Fth) provide quantitative knowledge on i) the strength of the so-called "deterministic" character of femtosecond

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