Comparison of calibration methods for atomic-force microscopy cantilevers (original) (raw)

Accurate determination of spring constant of atomic force microscope cantilevers and comparison with other methods

Yon-kyu Park

Measurement, 2010

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Atomic force microscope cantilever flexural stiffness calibration: Toward a standard traceable method

Jon Pratt

Journal of Research of the National Institute of Standards and Technology, 2011

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Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration

Peter Cumpson

Measurement Science and Technology, 2004

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Calibration of rectangular atomic force microscope cantilevers

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Short cantilevers for atomic force microscopy

Paul Hansma

Review of Scientific Instruments, 1996

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Note: Determination of torsional spring constant of atomic force microscopy cantilevers: Combining normal spring constant and classical beam theory

Mark Rutland

Review of Scientific Instruments, 2013

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Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI

Peter Cumpson

Nanotechnology, 2003

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Miniaturized single-crystal silicon cantilevers for scanning force microscopy

Patrick Frederix

2005

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Variations in properties of atomic force microscope cantilevers fashioned from the same wafer

Geoff Stevens

Nanotechnology, 2008

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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Alexander Balatsky

Beilstein Journal of Nanotechnology, 2014

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Special cantilever geometry for the access of higher oscillation modes in atomic force microscopy

Jose Plaza

Applied Physics Letters, 2006

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MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

Joël Chevrier

2005

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Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Andrius Dzedzickis

Materials

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Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

Robert Keller

Applied Physics Letters, 2016

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Finite Element Study Of The Metrological Aspects Of Atomic Force Microscope Cantilevers

Savas Mitridis

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Easy and direct method for calibrating atomic force microscopy lateral force measurements

Martin Guthold

2007

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Thermal calibration of photodiode sensitivity for atomic force microscopy

Mark Rutland

Review of Scientific Instruments, 2006

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Wide cantilever stiffness range cavity optomechanical sensors for atomic force microscopy

Vladimir Aksyuk

Optics Express, 2012

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Imaging using lateral bending modes of atomic force microscope cantilevers

Arnaud Caron

Applied Physics Letters, 2004

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Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements

Antoine Roy-Gobeil

EPJ Techniques and Instrumentation, 2020

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Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy

Jon Pratt

Journal of Applied Physics, 2010

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A direct micropipette-based calibration method for atomic force microscope cantilevers

Baoyu Liu

Review of Scientific Instruments, 2009

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Characterization and optimization of the detection sensitivity of an atomic force microscope for small cantilevers

Paul Hansma

Journal of Applied Physics, 1998

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A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy

Paul Hansma

Review of Scientific Instruments

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Interlaboratory round robin on cantilever calibration for AFM force spectroscopy

Phang Alan

Ultramicroscopy, 2011

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Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

Julien Vitard, Sinan D Haliyo

Review of Scientific Instruments, 2008

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Micromachined sample stages to reduce thermal drift in atomic force microscopy

Semih Sevim

Microsystem Technologies, 2014

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Cantilever tilt compensation for variable-load atomic-force microscopy

Matthew Brukman

2005

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