Influence of selected constructional and technological factors on tolerance and stability of thin-film resistors embedded in PCBs (original) (raw)

Environmental tests of embedded thin- and thick-film resistors in comparison to chip resistors

Circuit World, 2014

In this work environmental behavior of resistors embedded into Printed Circuit Boards (PCBs) and discrete chip resistors assembled to standard PCBs are co mpared. The investigations were based on the thin-film resistors made of NiP alloy, thick-film resistors made of carbon or carbon-silver inks as well as chip resistors in 0402 and 0603 packages. Thin-and thickfilm resistors were made in the bar form. In addition, poly mer thick-film resistive films were screen-printed on the several types finishing materials of contact terminations such as copper, silver, and gold. To determine the sensitivity of embedded resistors versus s tandard assembled chip resistors on environmental exposure the climatic chamber was used. The measurements of resistance were carried out periodically during the tests, and after the exposure cycles.

Stability of thin-film resistors embedded in printed circuit boards

2011 International Students and Young Scientists Workshop "Photonics and Microsystems", 2011

Long-term stability of embedded passives is very important issue. To determine this matter an aging process can be used, where test samples are exposed to environmental conditions. Objecti ve of this research was analyzing reliability of thin-fil m resistors based on Ohmega-Ply® technol ogy. Resistive material was a nickelphosphorus (Ni-P) alloy (wi th sheet resistance 25 Ω/sq or 100 Ω/sq) on FR-4 substrate. A number of vari ables were considered in this study (sheet resistance, geometry of resistor, type of cl adding, l aser trimming, pulse stress and environmental conditi ons). Two di fferent accelerated ageing processes-Ex-Situ (samples exposed to elevated temperature and/or rel ati ve humi di ty but resistance measurements made at room temperature) and In-Situ (resistance of test samples performed directly at the ageing condi tions) were carried out to perform long-term behavior analysis. The results revealed a significant influence of thickness of resistor, type of cladding and temperature on stability of investigated structures. Signification of other factors was negligible.

Thermal effects in embedded thin- and thick-film resistors in comparison to chip resistors

Circuit World, 2014

In this work environmental behavior of resistors embedded into Printed Circuit Boards (PCBs) and discrete chip resistors assembled to standard PCBs are co mpared. The investigations were based on the thin-film resistors made of NiP alloy, thick-film resistors made of carbon or carbon-silver inks as well as chip resistors in 0402 and 0603 packages. Thin-and thickfilm resistors were made in the bar form. In addition, poly mer thick-film resistive films were screen-printed on the several types finishing materials of contact terminations such as copper, silver, and gold. To determine the sensitivity of embedded resistors versus s tandard assembled chip resistors on environmental exposure the climatic chamber was used. The measurements of resistance were carried out periodically during the tests, and after the exposure cycles.

Preliminary assessment of the stability of thin- and polymer thick-film resistors embedded into printed wiring boards

Microelectronics Reliability, 2012

Embedding passive components into multilayer printed wiring boards (PWBs) meet electronic device requirements concerning the necessity of saving the surface board area for active elements, reducing board's size, improving device functionality and safety as well as overall product cost reduction. Since embedded components cannot be replaced after the board is completed, a long term stability and reliability are the important concerns for manufactures. This paper presents the results of examinations of embedded thin-film NiP resistors and polymer thickfilm resistors during their continuous operation and the influence of temperature on the resistance values after the simulation of a lead-free soldering process and after the temperature cycling test (À40 C/+85 C).

Selected properties of multi-terminal resistors embedded in printed circuit boards

Electron Technology Conference 2013, 2013

Modern electronic devices are more and more complex and multifunctional. It could be done by producing faster and more reliable active components and increasing number of passives and interconnections' density. To form such complex devices one can embed components in substrate of printed circuit board (PCB) or build multilayer boards. The other way is to form multi-terminal passive components to spare free surface and decrease number of interconnections. Authors created three-terminal thin-film (TF) resistors embedded in PCBs and investigated their selected properties such as resistance repeatability, long term stability, pulse durability and thermal characteristics.

Environmental qualification testing and failure analysis of embedded resistors

IEEE Transactions on Advanced Packaging, 2005

Embedding passive components (capacitors, resistors, and inductors) within printed wiring boards (PWBs) is one of a series of technology advances enabling performance increases, size and weight reductions, and potentially economic advantages in electronic systems. This paper explores the reliability testing and subsequent failure analysis for laser-trimmed Gould subtractive nickel chromium and MacDermid additive nickel phosphorous embedded resistor technologies within a PWB. Laser-trimmed resistors that have been "reworked" using an inkjet printing process to add material to their surface to reduce resistance have also been considered. Environmental qualification testing performed included: thermal characterization, stabilization bake, temperature cycling, thermal shock and temperature/humidity aging. In addition, a pre/post-lamination analysis was performed to determine the effects of the board manufacturing process on the embedded resistors. A failure analysis consisting of optical inspection, scanning acoustic microscope (SAM) and environmental scanning electron microscope (ESEM) imaging, and PWB cross-sectioning was employed to determine failure mechanisms. All the embedded resistors were trimmed and the test samples included resistors fabricated both parallel and perpendicular to the weave of the board dielectric material. Material stability assessment and a comparison with discrete resistor technologies was performed.

Influence of the Substrate on the Electrical Properties of Thick-Film Resistors

1980

The effect of substrate type on the electrical properties of thick film resistors is determined. Five different substrates are used. The following properties are investigated: thermal expansion, resistor profiles, resistance, TCR and resistor gauge factor. The resistors are physically inspected using X-ray diffractometry and electron probe analysis. This paper shows that conduction mechanism models for thick-film resistors generally need not take into account chemical and structural interactions with the substrate. However the effect of substrate on TCR values is significant for resistors exhibiting a large piezoresistive effect.

Electrical properties of thin-film resistors in a wide temperature range

Circuit World, 2015

Purpose -The purpose of this paper is to characterise electrical properties of Ni-P thin-film resistors made on FR-4 laminate in a wide range of temperature (fro m -180 to 20ºC). Design/methodolog y/approach -The study was performed using resistors made of nickel-phosphorus (Ni-P) foil with two different thicknesses (0.1 μm or 0.05 μm) and the same different sheet resistances (100 oh m/sq or 250 ohm/sq). The resistance rectangular resistors had length and width fro m the range between 0.59 and 5.91 mm. The resistance vs temperature characteristics and their distribution as well as resistors durability to low-temperature thermal shocks were investigated.

Stability of miniaturized non-trimmed thick- and thin-film resistors

Microelectronics Reliability, 2018

This paper is focused on reliability tests of non-trimmed miniaturized thin-film and thick-film resistors. Thickfilm resistors are screen printed by polymer paste on LTCC (Low Temperature Co-fired Ceramic) substrate by two different approaches. Nonstandard precise screen printing process provide tolerance of resistivity less than 5% and thus further trimming is not necessary. OhmegaPly material with Nickel Phosphorous (NiP) metal alloy is used for thin-film resistors fabricated by subtractive process. Miniaturized resistors have dimensions 0.5 × 0.5 mm, and thus 1 square, with thickness 1 μm for thin-film and 20 μm for thick-film resistors. Stability of miniaturized resistors were tested by humidity test, thermal shocks, long-term thermal ageing, direct current stress, current pulses and simulation of soldering process using VPS (Vapour Phase Soldering). Resistivity of resistors is measured by four wire method before and after each set of test and relative change of resistivity is plotted in graphs. Influence of every test on each type of resistor is analysed.