Predicting the Breakdown Behaviorof Microcontrollers Under EMP/UWB Impact Using a Statistical Analysis (original) (raw)

In order to protect electronic systems against the effects of transient electromagnetic interferences, shields made of electrically conductive material can be used. The subject of this paper is an electrically conductive textile. When applying the shield, a reliable measure is needed in order to determine the effectiveness of the shield to protect against electromagnetic pulses. For this purpose, a time domain measurement technique is presented using double exponential pulses. With these pulses, the susceptibility of an operating electronic device with and without the shield is determined. As a criterion of quality of a shield, the breakdown failure rate found in both cases is compared.

The field of susceptibility and hardening of electronic systems to transient threats has experienced a significant growth during the past ten years. Driven by the development in the area of non-lethal electromagnetic weapons it has become necessary to extend the classical set of transient threats, consisting of LEMP, ESD and NEMP, by a fast transient threat with an extreme bandwidth. The investigation of the susceptibility to those UWB threats, characterized by a bandwidth of more than a quarter of the center frequency, rise times of less than 200 ps and pulse durations in the ns regime, is of special interest. This paper presents an overview of current challenges of the hardening against UWB threats. It discusses recent research trends in transient susceptibility measurements , protection concepts and methods of analysis.

— Electromagnetic Pulses (EMP) attack on electronic circuits is a rising concern these days. Various electromagnetic weapons are mainly used for defense applications like Special Forces weapons and military weapons which have simple structure with huge vicious power. These electromagnetic weapons sustain enormous loss to the electronic circuit as well as system. This paper discusses about the electromagnetic pulse, damage effects of electromagnetic pulse and how to protect our electronics & electrical circuit from EM Pulse.

A susceptibility of different types of computer network routers to high power microwave pulse radiation was investigated. Experiments have been performed for different microwave power level, frequency band, pulse duration, and repetition rate. Experimental results were described using electronic fault models of thermal heating and parasitic charging.