A curved image-plate detector system for high-resolution synchrotron X-ray diffraction (original) (raw)
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Journal of Applied Crystallography, 2012
A prototype X-ray pixel area detector (XPAD3.1) has been used for X-ray diffraction experiments with synchrotron radiation. The characteristics of this detector are very attractive in terms of fast readout time, high dynamic range and high signal-to-noise ratio. The prototype XPAD3.1 enabled various diffraction experiments to be performed at different energies, sample-todetector distances and detector angles with respect to the direct beam, yet it was necessary to perform corrections on the diffraction images according to the type of experiment. This paper is focused on calibration and correction procedures to obtain high-quality scientific results specifically developed in the context of three different experiments, namely mechanical characterization of nanostructured multilayers, elastic-plastic deformation of duplex steel and growth of carbon nanotubes. research papers J. Appl. Cryst. (2012). 45 C. Le Bourlot et al. Prototype hybrid pixel detector 9 of 10 Figure 10
Powder Diffraction, 2006
A state-of-art semiconductor technology-based position sensitive area detector, namely D/teX-25, has recently been developed for high-speed and high-sensitivity X-ray diffraction (XRD) analysis of materials. X-ray powder diffraction intensities obtained by a D/teX-25 detector were found to over 50 times higher than those by a conventional scintillation counter. A D/teX-25 detector mounted on a conventional 2 kW XRD system has been used to collect ultrafast XRD data with scanning speeds up to 160°2θ per minute. Ultrahigh-speed XRD is particularly useful for time-resolved dynamical and in-situ studies. A D/teX-25 detector was successfully used on a Rigaku XRD differential scanning calorimetry (DSC) system for simultaneous measurements of XRD and DSC data under controlled temperature and humidity conditions. This has made possible the study of complex and rapid phase transformations of pharmaceutical terfenadine. The D/teX-25 area detector has also been used for recording two-dimension...
X - RAY DIFFRACTION: Instrumentation and Applications
Critical reviews in analytical chemistry / CRC, 2015
X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. This review summarizes the scientific trends associated with the rapid development of the technique of X-ray diffraction over the past five years pertaining to the field of pharmaceutical industry, forensic science, geological applications, microelectronics and glass industry, as well as in corrosion analysis.
Journal of the Ceramic Society of Japan, 2013
A new synchrotron X-ray diffractometer with a one-dimensional X-ray detector has been successfully developed for the purpose of high angular resolution, high efficiency and full automatic powder X-ray diffraction experiments. Sample-to-detector distance is designed to be 955 mm. This long distance enables us to obtain high angular resolution powder diffraction data. The onedimensional detector can observe 3.84 degrees in 2ª per one exposure, thus multiple exposures at every 2ª angle are required to collect a whole powder diffraction pattern. The minimum step size of 2ª is approximately 0.003 degrees. A full automatic datacollection system is achieved with a newly developed diffractometer control program that covers the whole system; a sample exchanger, a sample position adjustment, diffractometer axes and data collection. Diffraction peak profile and angular resolution are comparable to that of the imaging plate DebyeScherrer camera with the same sample-to-detector distance. Diffraction data of a standard sample (NIST-CeO 2) obtained by this system was analyzed properly using Rietveld method.
Use of new image-plate techniques in synchrotron radiation studies of materials and processes
Synchrotron radiation is used routinely for di~action measurements on crystalline powders and amorphous materials. The usual method of data collection is to use a diffractometer to scan a detector over a wide angular range, step-wise building up a 1-D diffraction pattern at an appropriate angular resolution. There are a number of drawbacks to this approach: there may well be 2-D information which is being ignored (or confused), and when collecting data at one point the diffracted intensity at all other scan intervals is not being recorded, ie. it is wasted. A l-D, or preferably Z-D, position sensitive detector is obviously required to optimise data collection. Image-plates offer a solution and we report here recent investigations of their use for both powder diffraction and amorphous materials. Gains of 100 in data collection time could be achieved in principle and this suggests the technology could not only improve the efficiency of use of expensive central resources, but could also open up new possibilities for studying materials processing in situ.
Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate
Journal of Applied Crystallography, 2000
A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions,i.e.at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reachesRw= 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient an...
Grazing Incidence X-Ray Diffraction using Synchrotron Light at SLRI
Journal of Physics: Conference Series, 2018
This work demonstrates the capability of the grazing incidence X-ray diffraction technique using synchrotron light. The measurement system is set up at the BL7.2W:MX beamline of the Synchrotron Light Research Institute (SLRI). The beamline utilizes hard X-rays from a 6.5-Tesla Superconducting Wavelength Shifter. The photon energy can be chosen between 7 to 18 keV with a photon flux of more than 10 10 photons/sec at 100mA stored electron beam. The X-ray beam size can be reduced down to 20 microns, allowing XRD measurements in grazing geometry, thus crystal structures of very thin films with a thickness of tens nanometers can be identified. The diffraction patterns are recorded with a 2D CCD detector, allowing more diffraction spots of single crystalline films to be recorded.
Multipurpose imaging-plate camera for in situ powder XRD at the GILDA beamline
Journal of Synchrotron Radiation, 2001
An Imaging-Plate (IP) camera for X-ray powder diffraction (XRPD) experiments was installed on the synchrotron radiation beamline GILDA at the ESRF. The IP camera can be used in fixed datacollection mode of the whole diffraction rings, or in translation mode for time-dependent experiments. The apparatus is ideal for collecting medium-to relatively high-resolution diffraction data from diluted or weakly scattering samples and to investigate in situ phase changes induced by temperature and/or chemical reactions. The possibility to rapidly collect several good quality diffraction patterns coupled with tunable beam energy allow for multiwavelength experiments such as anomalous XRPD.