Investigating substrate coupling noise impact on low-power memory controller PHY interface using on-chip measurement structure (original) (raw)

19th Topical Meeting on Electrical Performance of Electronic Packaging and Systems, 2010

Abstract

Abstract—This paper experimentally investigates substrate noise and its impact on the jitter performance of a low-power memory controller PHY interface using an on-chip substrate noise measurement structure. A previously proven on-chip supply noise measurement method is extended ...

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