Influence of the organic layer thickness in (Metal-Assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles (original) (raw)
Related papers
The Journal of Physical Chemistry B, 2000
The Journal of Physical Chemistry B, 2001
Energy distributions of atomic and molecular ions sputtered by C60+ projectiles
Applied Surface Science, 2006
Influence of massive projectile size and energy on secondary ion yields from organic surfaces
Mechanism for Increased Yield with SF 5 + Projectiles in Organic SIMS: The Substrate Effect
The Journal of Physical Chemistry A, 1999
Analytical Chemistry, 2008
Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectiles
Journal of the American Society for Mass Spectrometry, 2005
DESORPTION YIELDS USING keV POLYATOMIC PROJECTILES
Le Journal de Physique Colloques, 1989
Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga + , In + ) and Fullerene Projectiles
Analytical Chemistry, 2007
The role of internal energy of polyatomic projectile ions in surface-induced dissociation
Chemical Physics Letters, 2003
Sputtering of thin benzene and polystyrene overlayers by keV Ga and C60 bombardment
Applied Surface Science, 2006
Surface and Interface Analysis, 2010
The effect of incident angle on the C60+ bombardment of molecular solids
Applied Surface Science, 2008
Simultaneous Ejection of Two Molecular Ions from keV Gold Atomic and Polyatomic Projectile Impacts
Physical Review Letters, 2004
Absolute Auger Yield Measurements of P+, O+, N+, C+, and B+ Projectiles Following Foil Excitation
IEEE Transactions on Nuclear Science, 1979
Inferring ejection distances and a surface energy profile in keV particle bombardment experiments
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2000
Desorption of large organic molecules induced by keV projectiles
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2001
Projectile's mass, reactivity and molecular dependence on ion nanostructuring
Cornell University - arXiv, 2010
Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling
Journal of the American Society for Mass Spectrometry, 2007
The Journal of Physical Chemistry A, 2004
Secondary Molecular Ion Emission In Binary Projectile-Surface Collisions
AIP Conference …, 2003
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
Rapid Communications in Mass Spectrometry, 2010
Sputtering of Ag under C 60 + and Ga + projectile bombardment
Applied Surface Science, 2004
Sputtering of parent-like ions from large organic adsorbates on metals under keV ion bombardment
Surface Science, 1998
The Journal of Physical Chemistry B, 2005
Sputtering of Langmuir–Blodgett multilayers by keV C60 projectiles as seen by computer simulations
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2009
Projectile and target fragment correlations in the reaction
Nuclear Physics A, 1986