Multiple Parametric Circuit Analysis Tool for Detectability Estimation (original) (raw)

2007 14th IEEE International Conference on Electronics, Circuits and Systems, 2007

Abstract

In this paper a software tool is presented which is capable of producing testability metrics for analog and mixed-signal circuits. These metrics are obtained by performing probabilistic analysis techniques. The presented tool acts as a shell utilizing the power of state of the art external schematic and simulation programs and offers to the user a graphical interface for circuit design

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