Efficient testing of an optical feedback pixel driver using wavelet analysis (original) (raw)

2010 17th IEEE International Conference on Electronics, Circuits and Systems, 2010

Abstract

ABSTRACT A method for testing an optical feedback pixel driver (OFPD) is presented. It is based on the wavelet transformation of the measured output pixel current (IPIXEL) waveform. In the wavelet analysis, a test metric is introduced which relies on the wavelet energy computation from the trend and detail coefficients of the IPIXEL waveform. The proposed test method is general and may be applied also for testing other analog and mixed-signal circuits. Comparative simulation results are presented between the proposed method and a method utilizing the calculation of the integral of the IPIXEL. The results show a +13.33% improvement in fault coverage by using the proposed testing scheme.

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