Quantitative EDS analysis in transmission electron microscopy using unconventional reference materials (original) (raw)

Quantitative X-ray energy dispersive analysis with the transmission electron microscope

Roy Geiss

X-Ray Spectrometry, 1975

View PDFchevron_right

A flexible and accurate quantification algorithm for electron probe X-ray microanalysis based on thin-film element yields

Koen H Janssens

Spectrochimica Acta Part B: Atomic Spectroscopy, 2003

View PDFchevron_right

INVESTIGATIONS OF THIN LAYERS BY TEY, XRF, EPMA AND XPS - A COMPARISON OF X-RAY ANALYTICAL METHODS

Robert Praxmarer

1999

View PDFchevron_right

Metal location and thickness in a multilayered sheet by measuring< i> Kα/< i> Kβ,< i> Lα/< i> Lβ and< i> Lα/< i> Lγ X-ray ratios

Marcia Rizzutto

Nuclear Instruments and …, 2009

View PDFchevron_right

Influence of near-edge processes in the elemental analysis using X-ray emission-based techniques

Sunil Kumar

Pramana, 2011

View PDFchevron_right

Direct determination of crystal and surface structures in THEED

Sergei Dudarev

Ultramicroscopy, 1993

View PDFchevron_right

Experimental K X-ray intensity ratios of some heavy elements

Ali Gürol

Radiation Physics and Chemistry, 2017

View PDFchevron_right

A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM

Nestor J. Zaluzec

Microscopy and Microanalysis, 2016

View PDFchevron_right

Chemical effects on Kβ/Kα X-ray intensity ratios of Mo, Ag, Cd, Ba, La, Ce compounds and total mass attenuation coefficients of Fe and Cu

Ö. Sögüt

Spectrochimica Acta Part B: Atomic Spectroscopy, 2001

View PDFchevron_right

Effective atomic numbers and electron density of dosimetric material

Basavaraj Kerur

Journal of Medical Physics, 2009

View PDFchevron_right

Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

Vlado Valkovic

Mikrochimica Acta, 1998

View PDFchevron_right

The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material

Markus Blome

Microscopy and Microanalysis, 2006

View PDFchevron_right

Measurement of the X-ray mass attenuation coefficients of silver in the 5–20 keV range

Lachlan Tantau, M Tauhidul Islam

Journal of Synchrotron Radiation, 2014

View PDFchevron_right

Measurement of K shell absorption edge jump factors and jump ratios of some medium Z elements using EDXRF technique

necati kaya

Radiation Physics and …, 2010

View PDFchevron_right

Measurements of the K X-ray intensity ratios by using energy-dispersive X-ray fluorescence spectrometry

Ali Gürol

Applied Radiation and Isotopes, 2008

View PDFchevron_right

Technique charts for EC film: direct optical measurements to account for the effects of X-ray scatter

Kevin Jordan

International Journal of Radiation Oncology*Biology*Physics, 2001

View PDFchevron_right

Experimental determination of light-element k-factors using the extrapolation technique: Oxygen segregation in aluminium nitride

Michael Notis

Journal of Microscopy, 1992

View PDFchevron_right

S. K. Sharma (ed.), Handbook of Materials Characterization, Chapter

Abdullah M. Asiri

View PDFchevron_right

Energy-Dispersive X-Ray Fluorescence Determination of Pure-Element Intensities Using the “Low-Concentration Method”

Raymond Bwano Donatus

Analytical Sciences, 1994

View PDFchevron_right

Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope

Fernando Nieto

American Mineralogist, 2009

View PDFchevron_right

K- Shell X-ray Intensity Ratios of Fe, Ag and Te via Electron Capture Decay Employing 2π geometry S. B. Gudennavar1*, S.G. Bubbly1, Daisy Joseph2, P. V. Sreevidya1 and Linu George1 1Department of Physics, Christ University, Bangalore-560 029, INDIA 2Nuclear Physics Division, Bhabha Atomic Researc...

Daisy Joseph

Canadian Journal of Physics

View PDFchevron_right

EDS Quantification Using Fe L Peaks and Low Beam Energy

Jens Rafaelsen

Microscopy and Microanalysis, 2021

View PDFchevron_right

Is Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry (SEM/EDS) Quantitative?

Nicholas Ritchie

Scanning, 2013

View PDFchevron_right

Effective atomic numbers and electron density of

Prof. Basavaraj Rachappa Kerur

View PDFchevron_right

New consistency tests for high-accuracy measurements of X-ray mass attenuation coefficients by the X-ray extended-range technique

Jack L Glover

Acta Crystallographica Section A Foundations of Crystallography, 2012

View PDFchevron_right

Standardless EDXRF technique using bremsstrahlung radiation from a transmission type x-ray generator

Debasis Mitra

arXiv (Cornell University), 2019

View PDFchevron_right

Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy

Eric Lifshin

Microscopy and Microanalysis, 2010

View PDFchevron_right

Using Bulk Standards for Quantification of STEM-in-SEM EDX Spectra

Nicholas Ritchie

Microscopy and Microanalysis

View PDFchevron_right

Quantitative EDX Analysis in TEM. Practical Development, Limitations and Standards

Fernando Nieto

View PDFchevron_right

Sensitivity and Figure of Merit Measurements of EELS vs XEDS in the Analytical Electron Microscope

Nestor J. Zaluzec

Microscopy and Microanalysis, 2020

View PDFchevron_right

EELS quantification of the elements Ba to Tm by means of N45 edges

Ferdinand Hofer

Journal of Microscopy, 1989

View PDFchevron_right

Rapid Method for the Determination of TEM Foil Thickness

Agah Uguz

View PDFchevron_right

Chemical-effect variation of K β/K α X-ray intensity ratios in 3d elements

hasan erdoğan

Radiation Physics and Chemistry, 2002

View PDFchevron_right