Analysis of some Criteria of technological Efficiency of Mineral Processes by Partition Curves (original) (raw)
Annotation On the example of wet screening of polydispersed materials, partition curves have been plotted depending on the cumulative percent of the narrow fractions of the separated material passed in the feed. According to these graphs, a comparative analysis of three technological criteria for evaluating the efficiency of technological processes used in industry was made – those of K. Hancock, Derrick Corporation and the author of the article. Their properties, difference and field of application were determined. It is known that a partition curve is a graph of the function of partition coefficients of the material to beneficiated final products, depending on their physical-mechanical properties (particle size distribution, density, magnetic property, etc.). Fractional analysis by physical parameters requires additional experiments and is not always possible, for example, in flotation. However, the shape of the partition curve does not change, if the numerical cumulative value of the content of the useful component in the source material, passed in the feed α, is used as an argument instead of the physical parameter δ, since there is a functional relationship between δ and α. This transformation is equivalent to changing the scale of the argument. In [1], graph-analytic analysis of the partition curves Pc i = f (α) was performed, as a result of which a technological criterion of the mineral processes efficiency was proposed and its properties were investigated. As a numerical example, a screening process was analyzed. The general view of the real differential partition curve RTH of an undersize product is shown in Fig. 1. The figure contains the notation for individual sections of the square ABCD, which is divided by the partition curves: the real curve RTH, the ideal broken partition line BLKD and the broken line BMND of dividing the material into parts without changing its qualitative composition. The area under the partition curve RTN is equal to the yield of the undersize (concentrate) γ us ; the area above the partition curve is equal to the yield of the oversize (waste) γ os .