Impact of negative bias temperature instability on digital circuit reliability (original) (raw)
Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress
Mingxiang Wang
IEEE Transactions on Electron Devices, 2000
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IEEE Transactions on Electron Devices, 2000
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Degradation Behaviors of Metal-Induced Laterally Crystallized n-Type Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stresses
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