Influence of processing variables on the structure and properties of ZnO films (original) (raw)

Zinc oxide films exhibit multifunctional properties making them suitable for opto-electronic applications. This research investigates the influence of various deposition techniques such as reactive sputtering, pulsed laser deposition, and aqueous solution methods on the crystalline structure, electrical conductivity, and optical characteristics of these films. Characterization includes Raman spectroscopy to determine the wurtzite phase, assessing residual stress, and examining the impact of processing variables like film thickness, deposition temperature, and substrate material on the quality of the ZnO films.