Calculation of all elements of the Mueller matrix for scattering of light from a two-dimensional randomly rough metal surface (original) (raw)
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Calculation of the Mueller matrix for scattering of light from two-dimensional rough surfaces
Physical Review A, 2012
We calculate all the elements of the Mueller matrix, which contain all the polarization properties of light scattered from a two-dimensional randomly rough lossy metal surface. The calculations are carried out for arbitrary angles of incidence by the use of nonperturbative numerical solutions of the reduced Rayleigh equations for the scattering of p-and s-polarized light from a two-dimensional rough penetrable surface.
2021
An approach is presented for the inversion of experimental in-plane, co-polarized light scattering data in p and s polarization to obtain the normalized surface-height autocorrelation function and the rms-roughness of a two-dimensional randomly rough metal surface. The approach is based on an expression, obtained on the basis of second-order phase perturbation theory, for the contribution to the mean differential reflection coefficient from the light scattered diffusely by the rough surface. The inversion scheme is validated by using several sets of computer generated scattering data for rough silver surfaces defined by Gaussian surface height correlation functions. The reconstructions obtained by this approach are found to be rather accurate for weakly rough surfaces illuminated by pand s-polarized incident light; this is also true in cases where the contributions to the input data from multiple scattering of surface plasmon polaritons is not insignificant. Finally, the inversion s...
Polar decomposition of Mueller matrices for 2D-structured surfaces
EPJ Web of Conferences, 2010
In this research, the Polar Decomposition (PD) has been applied to the Mueller matrices (MMs) of the light scattered by linear ribs of rectangular profile on a flat substrate. Although photo-lithographic technique produces a silicon surface, metallic character is acquired by sputtering with gold some of the samples. With a dual rotating compensator polarimeter the MMs are obtained by Fourier Transform analysis. The samples have been numerically modeled by using both FDTD and Extinction Theorem (ET) and MMs have been computed from the results. The scattering depends strongly on the geometry and composition of the ribs, and this sensitivity is noticed for instance in M 11 element. But information offered by PD parameters is shown to be more apprehensible, like the substrate-induced depolarization or the retardance associated to the rib width.
Frontiers in Physics, 2013
A formalism is introduced for the non-perturbative, purely numerical, solution of the reduced Rayleigh equation for the scattering of light from two-dimensional penetrable rough surfaces. As an example, we apply this formalism to study the scattering of p-or s-polarized light from twodimensional dielectric or metallic randomly rough surfaces by calculating the full angular distribution of the co-and cross-polarized intensity of the scattered light. In particular, we present calculations of the mean differential reflection coefficient for glass and silver surfaces characterized by (isotropic or anisotropic) Gaussian and cylindrical power spectra. The proposed method is found, within the validity of the Rayleigh hypothesis, to give reliable results. For a non-absorbing metal surface the conservation of energy was explicitly checked, and found to be satisfied to within 0.03%, or better, for the parameters assumed. This testifies to the accuracy of the approach and a satisfactory discretization.
Journal of the Optical Society of America A, 2014
We present rigorous, nonperturbative, purely numerical solutions of the Rayleigh equations for the scattering of p-and s-polarized light from a two-dimensional randomly rough perfectly conducting surface. The solutions are used to calculate the reflectivity of the surface, the mean differential reflection coefficients, and the full angular distribution of the intensity of the scattered field. These results are compared with previously published rigorous numerical solutions of the Stratton-Chu equations, and very good agreement is found.
Resonance effects in multiple light scattering from statistically rough metallic surfaces
Physical Review B, 1992
Multiple scattering of light from one-dimensional random rough metallic surfaces is numerically studied by means of a Monte Carlo simulation method based on the extinction-theorem boundary conditions. Angular and integrated distributions of the mean scattered intensity are computed for several values of the angle of incidence, state of polarization, surface statistical parameters, and dielectric permittivity. Two main regimes are addressed, depending on whether the surface correlation length T is larger or smaller than the wavelength A, . In the first case, we observe enhanced backscattering both for s and p waves, whereas in the latter situation there exist substantial absorption effects under p polarization, linked to the excitation of surface polaritons. In addition, calculations are made of field enhancements on the surface, owing either to surface-polariton excitation in the small-correlation-length case (T & A, ), or to multiple scattering and generation of other kinds of surface wave in the large-correlation-length case (T & A, ).
Theory of light scattering from a rough surface with an inhomogeneous dielectric permittivity
Physical review B, 1984
First-order perturbation theory is applied to calculate scattering of a plane wave from a planebounded, semi-infinite medium where the boundary surface has a roughness perturbation and the scattering medium consists of an isotropic perturbation of the dielectric permittivity. The dielectric perturbation is assumed to fluctuate randomly in the plane parallel to the surface and decay exponentially with depth into the surface. Both the roughness and dielectric permittivity perturbations, which are treated as random variables, can independently cause scattering, and there is generally interference between the two scattered fields. The scattered fields generally depend on the autocovariance functions of the surface roughness and dielectric fluctuations and on the crosscorrelation properties between them. For this reason, the polarization ratio of the pand spolarized scattered light fields depends on the autocovariance and cross-correlation statistical properties. This result is unlike the calculation of scattered fields caused by roughness or dielectric perturbations alone, since in this case the polarization ratios of the scattered fields do not depend on the statistical properties of the perturbation. The numerical results of this work are consistent with experimental measurements where the polarization ratio of light scattered from nominally identical silver films varies widely from surface to surface.