Vertically Arranged Zinc Oxide Nanorods as Antireflection Layer for Crystalline Silicon Solar Cell: A Simulation Study of Photovoltaic Properties (original) (raw)
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Zinc oxide (ZnO), a direct bandgap semiconductor, provides tremendous promise in various applications, such as optical waveguides, clear conductive oxides, and chemical gas sensors. It is also used in UV-light emitters, piezoelectric transducers. ZnO is in various forms, such as nanoparticles, Nano-belts, Nano-rods, nano-tubes, and nanowires. The purpose of this research is to review a general overview of ZnO and its application, the use of ZnO as an anti-reflection coating with various styles on the solar cells, and the conventional and unconventional techniques that had been used to coating the anti-reflection layers on the solar cell will be reviewed. This is based on a review of previous studies related to applications of anti-reflective coatings of ZnO and make a comparison of practical results was obtained with different semiconductor materials (SIC, TiO2, ZnS, SiO2, SiN4).
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Journal of Alloys and Compounds, 2017
Electric measurements were performed on solar cells composed of n-type ZnO nanorods grown by the hydrothermal method on p-type silicon substrate. The nanorods were covered with silver nanoparticles of sizes 20-30 nm and 50-60 nm. The diameters and density of the nanorods and nanoparticles were determined from scanning electron microscopy (SEM) and atomic force microscopy (AFM) images. On top of the structures the ZnO:Al (AZO) layer was deposited as a transparent electrode using the atomic layer deposition (ALD) method. The efficiency of the cells was found to be ~3.4%, however the sample with larger nanoparticles exhibit better performance. The analysis of the current-voltage (I-V) measurements vs illumination intensity let us conclude that the surface recombination deteriorates their performance. The measurements of capacitance-voltage (C-V) characteristics allowed us to determine the concentration of donors in ZnO and built-in voltage at the ZnO/Si interface. The deep level transient spectroscopy (DLTS) measurements confirmed the presence of defects at the surface as well as deeper in the ZnO nanorods. Obtained results compared with the data reported elsewhere let us conclude that the defect density is much less than in the case of similar heterojunction ZnO/Si solar cells made by other technological methods.
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