Identification of nano-phases: relative merit of local analysis techniques (HRTEM, nanodiffraction, EDS/EELS) (original) (raw)

Abstract

Information for phase identification may be gathered in the electron transmission microscope with spatial resolution down to the nanometre scale. Energy dispersive X-ray and electron energy loss spectrometries are based on inelastic electron- sample interaction. They have the advantage to give a direct knowledge of the chemical nature of the atoms under the electron probe, sometimes also with valence and

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