Identification of nano-phases: relative merit of local analysis techniques (HRTEM, nanodiffraction, EDS/EELS) (original) (raw)
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Structural and analytical characterization, in the nanometer scale, has become very important for all types of materials in recent years. Transmission electron microscope (TEM) is a perfect instrument for this purpose, which is summarized in this chapter. Parameters such as particle size, grain size, lattice type, morphological information, crystallographic details, chemical composition, phase-type, and distribution can be obtained by transmission electron micrographs. Electron diffraction patterns of nanomaterials are also used to acquire quantitative information containing size, phase identification, orientation relationship and crystal defects in the lattice structure, etc. In this chapter, typical electron diffraction, highresolution transmission and scanning transmission electron microscope imaging in materials research, especially in the study of nanoscience are presented.
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Zeitschrift Fur Kristallographie, 2010
An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.