Synchrotron beamline optics for X-ray powder diffraction under high-pressure conditions at the Siam Photon Laboratory (original) (raw)
Related papers
Operational status of the X-ray powder diffraction beamline at the SESAME synchrotron
Journal of Synchrotron Radiation
The Materials Science (MS) beamline at SESAME (Synchrotron-light for Experimental Science and Applications in the Middle East), dedicated to the X-ray powder diffraction technique, started its operational phase in December 2020 by hosting its first users. The MS endstation comprises a two-circle diffractometer coupled with a PILATUS 300K area detector, with which direct beam images are collected and compared with the initial ray-tracing simulation results. We present a detailed description of the beamline components and the experimental characterization of the main instrumental parameters relying on the instrumental profile and the angular resolution. A representative example for microstructure investigations of a nanocrystalline material is demonstrated.
Focusing Optics for High-Energy X-ray Diffraction
Journal of Synchrotron Radiation, 1998
Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40–100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 µm-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techn...
High-pressure monochromatic powder diffraction using a Bragg-Laue monochromator and a walker cell
Journal of Physics and Chemistry of Solids, 2006
The multi-anvil high-pressure facility on beamline 16.4 of the Synchrotron Radiation Source at Daresbury Laboratory has been upgraded from energy-dispersive diffraction operation to easily interchangeable energy-dispersive and angle-dispersive operation by the addition of a Laue-Bragg monochromator and an imaging plate detector. Details of the Laue-Bragg monochromator and endstation configuration are given. The performance of the end station is illustrated with data collected as part of a high temperature-pressure study of lawsonite.
Journal of the Ceramic Society of Japan, 2013
A new synchrotron X-ray diffractometer with a one-dimensional X-ray detector has been successfully developed for the purpose of high angular resolution, high efficiency and full automatic powder X-ray diffraction experiments. Sample-to-detector distance is designed to be 955 mm. This long distance enables us to obtain high angular resolution powder diffraction data. The onedimensional detector can observe 3.84 degrees in 2ª per one exposure, thus multiple exposures at every 2ª angle are required to collect a whole powder diffraction pattern. The minimum step size of 2ª is approximately 0.003 degrees. A full automatic datacollection system is achieved with a newly developed diffractometer control program that covers the whole system; a sample exchanger, a sample position adjustment, diffractometer axes and data collection. Diffraction peak profile and angular resolution are comparable to that of the imaging plate DebyeScherrer camera with the same sample-to-detector distance. Diffraction data of a standard sample (NIST-CeO 2) obtained by this system was analyzed properly using Rietveld method.
Synchrotron X-Ray Powder Diffraction
NATO Science for Peace and Security Series B: Physics and Biophysics, 2012
The large breadth of the Synchrotron Radiation X-ray Powder Diffraction (SR-XRPD) technique inevitably requires that we make a certain number of choices in its discussion. Assuming you already have some knowledge of SR and XRPD, we explore the peculiar features that arise from combining them. From the perspective of a beamline scientist, we discuss aspects influencing the beamline optics, diffractometer, detectors and sample environments with attention to details important to perform outstanding SR-XRPD experiments. We begin with a brief overview of SR characteristics and properties and finish with a few SR-XRPD highlights. An extensive literature citation is provided for those who want to delve deeper into those topics that are inevitably not completely covered here.
Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate
Journal of Applied Crystallography, 2000
A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions,i.e.at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reachesRw= 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient an...
Graded X-ray Optics for Synchrotron Radiation Applications
Journal of Synchrotron Radiation, 1998
Using X-ray diffractometry and spectral measurements, the structure and properties of graded X-ray optical elements have been examined. Experimental and theoretical data on X-ray supermirrors, which were prepared by the magnetron sputtering technique using precise thickness control, are reported. Measurements on graded aperiodic Si1−x Ge x single crystals, which were grown by the Czochralski technique, are also presented. The lattice parameter of such a crystal changes almost linearly with increasing Ge concentration. The measurements indicate that Si1−x Ge x crystals with concentrations up to 7 at.% Ge can be grown with a quality comparable to that of pure Si crystals.
Observation of horizontal focusing of X-rays using a toothed-crystal monochromator
Journal of Synchrotron Radiation, 1998
The behaviour of a toothed-crystal monochromator for synchrotron radiation was studied for the first time on the GILDA CRG beamline at the ESRF. A new kind of horizontal focusing was observed which may be attributed to the properties of inclined diffraction. We have also observed a vertical focusing of the beam, the nature of which remains unexplained.
X-Ray Diffraction under Extreme Conditions at the Advanced Light Source
Quantum beam science, 2018
The more than a century-old technique of X-ray diffraction in either angle or energy dispersive mode has been used to probe materials' microstructure in a number of ways, including phase identification, stress measurements, structure solutions, and the determination of physical properties such as compressibility and phase transition boundaries. The study of high-pressure and high-temperature materials has strongly benefitted from this technique when combined with the high brilliance source provided by third generation synchrotron facilities, such as the Advanced Light Source (ALS) (Berkeley, CA, USA). Here we present a brief review of recent work at this facility in the field of X-ray diffraction under extreme conditions, including an overview of diamond anvil cells, X-ray diffraction, and a summary of three beamline capabilities conducting X-ray diffraction high-pressure research in the diamond anvil cell.