Embedded Integrated Circuit Testing based on Artificial Immune System (original) (raw)

2014

Abstract

An embedded module testing scheme using embedded processor into System-on-Chip (SoC), Systemin- Package (SiP) or System-on-Board (SoB) is presented. Such a processor executes a test program based on immune system for testing the module under test. To design the proposed scheme, it is applied the Negative-Selection Mechanism of the immune system, which is able to discriminate between the self (body’s own cell) and any foreign cell (non-self). Experimental results show the effectively of this scheme.

Cleonilson Protasio hasn't uploaded this paper.

Let Cleonilson know you want this paper to be uploaded.

Ask for this paper to be uploaded.