Electrical transport measurements on off-axis n-Si samples (original) (raw)

Semiconductor Science and Technology, 1990

Abstract

Charge transport calculations carried out for thin plate-shaped off-axis n-Si samples have pointed to the likelihood that a longitudinal electric field induces space charge layers at the sample surfaces. Current-voltage measurements on such samples provide evidence of excess current flow attributable to conduction in the surface space charge layers predicted by theory.

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