Properties of cadmium sulphide thin films deposited from a chemical solution (original) (raw)
1999, Annales De Chimie-science Des Materiaux
Cadmium sulphide thin films have been deposited chemically at different temperatures from 50 "C to 100 'C. The composition of the solution was [CdCl2] = 0.01 M, [Thiourea] = 0.17 M, [NH4Cl] =0.036 M and [NH31 = 0.36 M. Structural, electrical and optical properties were investigated as a function of deposition parameters. The films showed strongly oriented structures and were highly transmitting in the infrared region. Their absorption coefficient was in the range lo4 to 105 cm-l in the visible region. The direct forbidden band had an energy gap of 2.48 eV and the refractive index for high wavelengths was equal to 2.116. The dark resistivities of as-deposited films thicker than 0.5 pm had values from 103 to 105 Qcm. These resistivities decreased to about 10 Qcm after annealing in vaccum or in argon atmosphere at 200°C for one hour.
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