Phase Identification by Selected Area Electron Diffraction (original) (raw)
A new phase consistency criterion and its application in electron crystallography
Wanzhong He
Ultramicroscopy, 2000
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Refinement of orientation relations occurring in phase transformation based on considering only the orientations of the variants
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Remark on the Phase Problem in Crystallography
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Direct methods and superstructures. I. Effects of the pseudotranslations on the reciprocal space
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A Concept for Crystal Structure Determination without FOURIER Inversion: Some Steps towards Application
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The crystallographic symmetry test for the correctness of a set of phases
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Acta Crystallographica Section A Foundations of Crystallography, 2003
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Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
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Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
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Group theory description of transformation pathway degeneracy in structural phase transformations
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Acta Materialia, 2016
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Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples
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Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
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Precession electron diffraction and its utility for structural fingerprinting in the transmission electron microscope
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2009
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Structure refinement using precession electron diffraction tomography and dynamical diffraction: theory and implementation
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Automatic recovery of missing amplitudes and phases in tilt-limited electron crystallography of two-dimensional crystals
John Spence
Physical Review E, 2011
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An efficient computational method for use in structural studies of crystals with substitutional disorder
Alberto Gonzalez García
Journal of Physics: Condensed Matter, 2010
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On the absolute configuration determination by X-ray diffraction data
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Automated diffraction tomography combined with electron precession: a new tool forab initionanostructure analysis
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Extending the charge-flipping method towards structure solution from incomplete data sets
Walter Steurer, Lukás Palatinus, Gervais Chapuis
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Acquisition and Analysis of Serial Electron Diffraction Data for Structure Determination
Jessica Besaw
Microscopy and Microanalysis
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Study of crystalline structures via physical determination of triplet phase invariants
S. Morelhão, S. Kycia
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Synergy between transmission electron microscopy and powder diffraction: application to modulated structures
Joke Hadermann
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Structure factor determination in non-centrosymmetric crystals by a two-dimensional CBED-based multi-parameter refinement method
Knut Marthinsen
Ultramicroscopy, 1993
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Robustness of the quantitative phase analysis of X-ray diffraction data by the Rietveld method
Matthew Rowles
arXiv: Materials Science, 2020
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Comparison of convergent beam electron diffraction methods for simultaneous structure and Debye Waller factor determination
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Ultramicroscopy, 2013
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