Manipulating Interfaces through Surface Confinement of Poly(glycidyl methacrylate)- block -poly(vinyldimethylazlactone), a Dually Reactive Block Copolymer (original) (raw)
Instrumentation Thermal Analysis. Standard thermal gravimetry experiments were performed on a TA Instruments Q5000IR TGA. Samples were heated in platinum pans from ambient temperature to 600.0°C at 20.0°C/min. A TA Instruments Q1000 Differential Scanning Calorimeter (DSC) was used to evaluate thermal transitions of the (co)polymers. Samples (~ 3-8 mg) were prepared in standard aluminum pans/lids and were first heated from ambient temperature to 160.0°C at a ramp rate of 20.0°C/min. Samples were subsequently cooled to-50.0°C at 25.0°C/min and finally heated to 160.0°C at 20.0°C/min. Glass transition temperatures are reported from the second heating as the mid-point of the heat flow derivative curve. The DSC was calibrated using indium standard (In; melting point, T m, In = 156.6 °C; provided by TA Instruments) according to the manufacturer's recommendation, which includes baseline and temperature calibrations. Additionally, standard thermal gravimetry experiments were performed on a TA Instruments Q5000IR TGA. Samples were heated in platinum pans from ambient temperature to 600.0°C at 20.0°C/min. Raman Microspectroscopy. Raman spectroscopy of thin polymer films were performed using a Renishaw 100 confocal micro-Raman system equipped with a CCD detector. A 632.8 nm HeNe laser was focused to 2 µm spot size with a 50x objective. Raman spectra were acquired using a 60 s integration time. Atomic Force Microscopy. A Digital Instruments Dimension 3100 atomic force microscope (AFM) was used in tapping mode to obtain height images of 1000 µm lines of a PGMA 73-b-PVDMA 174 copolymer spin-coated from solution in CHCl 3 at a concentration of 0.75% wt and annealed under vacuum at 110 °C. The micropattern was made by photolithographic techniques. 1 The amplitude set-point and proportional and integral gains were adjusted for each sample assuring optimal image quality. All measurements were done at a scanning rate of 0.5 Hz using silicon nitride cantilevers. An area of 8 µm × 8 µm at the edge of the pattern was initially surveyed in order to obtain a direct comparison of layer thickness values obtained by AFM and by ellipsometry. Then, a 2 µm × 2 µm area on the polymer layer was sampled, which allowed the film's topography and roughness to be examined.
Sign up for access to the world's latest research.
checkGet notified about relevant papers
checkSave papers to use in your research
checkJoin the discussion with peers
checkTrack your impact
Loading Preview
Sorry, preview is currently unavailable. You can download the paper by clicking the button above.