Formation of a donor profile in silicon upon simultaneous implantation of phosphorus and sodium ions (original) (raw)

Substitutional placement of phosphorus in ion implanted silicon by recrystallizing amorphous/crystalline interface

Devendra Sadana

Journal of Applied Physics, 1983

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Structural Changes in Phosphorus-Ion-Implanted Silicon

Zbigniew Swiatek, I. M. Fodchuk

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Reduction of phosphorus transient enhanced diffusion due to extended defects in ion implanted silicon

P. Negrini

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989

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Effects of Low Dose Silicon, Carbon, and Oxygen Implantation Damage on Diffusion of Phosphorus in Silicon

Samir Chaudhry

Journal of The Electrochemical Society, 1994

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Silicon Doping Performed by Different Diffusion Sources Aiming Co-Diffusion

Roland Zengerle

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First-principles study of hydrogen-enhanced phosphorus diffusion in silicon

Dam Chi

Journal of Applied Physics, 2016

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Characterization of silicon doped with sodium upon high-voltage implantation

Yuriy Kudriavtsev

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2009

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N-type doping of silicon by proton implantation

J. Lutz

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Simple Method for Phosphorus Diffusion on <100> Oriented P-Type Silicon Using New Phosphorus Gel as Dopant

rémi ndioukane

Applied Physics Research, 2015

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Phosphorus ion implantation in silicon nanocrystals embedded in SiO[sub 2]

Naoki Fukata

Journal of Applied Physics, 2009

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Channeling effect of P implantation in Si(100)

Sean Corcoran

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991

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n–p Junction formation in p-type silicon by hydrogen ion implantation

Alexander Ulyashin

Solar Energy Materials and Solar Cells, 2002

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First-principles study of phosphorus diffusion in silicon: Interstitial and vacancy-mediated diffusion mechanisms

Michael Masquelier

Applied Physics Letters, 2003

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Low-temperature diffusion of high-concentration phosphorus in silicon, a preferential movement toward the surface

Josine Loo

Applied Physics Letters, 2005

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Incomplete ionization and carrier mobility in compensated p-type and n-type silicon

Erwann Fourmond, M. Lemiti

2013

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Gettering impurities from crystalline silicon by phosphorus diffusion using a porous silicon layer

Messoud hajji

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Analysis of the SiO2 defects originated by phosphorus implantation in MOS structures

Sebastian Bota

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1993

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Simulation of the Phosphorus Profiles in a c-Si Solar Cell Fabricated Using POCl3 Diffusion or Ion Implantation and Annealing

Tom Janssens

Energy Procedia, 2013

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Impact of incomplete ionization of dopants on the electrical properties of compensated p-type silicon

M. Lemiti, Erwann Fourmond

Journal of Applied Physics, 2012

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Athermal annealing of phosphorus-ion-implanted silicon

Martin Peckerar

Applied Physics Letters, 2000

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Diffusion of implanted sodium in oxygen-containing silicon

Vadim Korol', Vadim Korol

Semiconductors, 2008

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ESR studies of ion implanted phosphorus donors near the Si-SiO2 interface

Libu K Alexander

2010

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The simple approach to determination of active diffused phosphorus density in silicon

Morteza Ghamsari

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Activation of dopant in silicon by ion implantation under heating sample at 200 °C

Yutaka Inouchi

Applied Physics A, 2018

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Investigation of Ion implantation induced electrically active defects in p-type silicon

Jayantha Senawiratne

2009 IEEE International SOI Conference, 2009

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Analysis of phosphorus-doped silicon oxide layers deposited by means of PECVD as a dopant source in diffusion processes

Jochen Rentsch

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Diffusion of phosphorus in arsenic and boron doped silicon

S. Dunham

Applied Physics Letters, 1995

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EFFECTS OF POST DOPANT IMPLANTATION ANNEALINGS ON ELECTRICAL PROPERTIES OF SILICON CHARGE CARRIERS

Abdelfettah BARHDADI

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Reverse annealing effects in heavy ion implanted silicon

Anders Hallén

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1999

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The effect of low-energy ion-implantation on the electrical transport properties of Si-SiO2 MOSFETs

Andrew Greentree

2004

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Phosphorus diffusion gettering process of multicrystalline silicon using a sacrificial porous silicon layer

Hatem Ezzaouia

Nanoscale Research Letters, 2012

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