A ANN-Based Defects ’ Diagnosis of IndustrialOptical Devices (original) (raw)

A major step for high-quality optical devices faults diagnosis concerns scratches and digs defects detection and characterization in products. These kinds of aesthetic flaws, shaped during different manufacturing steps, could provoke harmful effects on optical devices’ functional specificities, as well as on their optical performances by generating undesirable scatter light, which could seriously damage the expected optical features. A reliable diagnosis of these defects becomes therefore a crucial task to ensure products’ nominal specification. Moreover, such diagnosis is strongly motivated by manufacturing process correction requirements in order to guarantee mass production quality with the aim of maintaining acceptable production yield. Unfortunately, detecting and measuring such defects is still a challenging problem in production conditions and the few available automatic control solutions remain ineffective. That’s why, in most of cases, the diagnosis is performed on the basi...