Jitter Test of Waveform Recorders (original) (raw)

IEEE 1057 Jitter Test of Waveform Recorders

IEEE Transactions on Instrumentation and Measurement, 2009

The jitter test of analog to digital converters is traditionally carried out with one of the methods recommended in the IEEE Standard for Digitizing Waveform Recorders, std. 1057. Here we study the uncertainty of one of those methods and point out the bias inherent to the estimator recommended for measuring the ADC jitter and suggest an alternate estimator. Expressions are also presented for the determination of the precision of a given estimate from the number of samples used, the standard deviation of the additive noise present in the test setup, the jitter standard deviation and the stimulus signal parameters. In addition, an expression for the computation of the minimum number of samples required to guarantee a given bound on the estimation uncertainty is presented which is useful in optimizing the test duration.

Characterisation and modelling of the ADC jitter

The use of the Allan variance for the characterisation of the jitter error in analog-to-digital converters (ADCs) is proposed. In particular, the Allan variance is a sound basis for defining a figure of merit for jitter errors, diagnosing the jitter noise type, and including a jitter block into a previously proposed ADC model. Experimental results highlighting the effectiveness of the Allan variance in the characterisation of the ADC jitter error are discussed.

Pitfalls and errors in measuring jitter

Clinical Neurophysiology, 2017

Highlights  Quality requirements for jitter analysis with concentric needle electrodes.  Jitter recordings with voluntary activation; how to detect and handle artefacts.  Jitter recordings with electrical stimulation; how to detect and handle artefacts.

Characterization of digitizer timebase jitter by means of the Allan variance

Computer Standards & Interfaces, 2003

The use of the Allan variance for the characterization of the jitter timebase error in waveform digitizers is proposed. With this aim, the Allan variance is shown to be a sound basis for defining and measuring a suitable figure of merit, diagnosing the jitter noise type, and including a jitter error block into a previously proposed digitizer model. Experimental results highlighting the effectiveness of the Allan variance in the characterization of digitizer jitter error are discussed.

Jitter measurement circuit for mixed signal production test

Measurement, 2007

This paper presents a novel low-cost jitter measurement circuit for production test. The hardware implementation is based on the so-called analytic signal method. The circuit consists of two parts: high-speed ADC sampling and DSP computation. The uniqueness of this circuit comes from the fact that the FPGA is used as both the ADC sampling controller and the main computation engine, which can significantly reduce the test cost. To validate the design effectiveness, measurements results have been compared between various instruments and this proposed circuit.

Measurement of timing jitter contributions in a dynamic test setup for A/D converters

IEEE Transactions on Instrumentation and Measurement, 2001

This article provides a new method which permits one to separate and to obtain an accurate estimation of timing jitter contributions appearing in an analog-to-digital (A/D) converter dynamic common test setup. The results are obtained using coherent sampling configuration and are independent of quantization and nonlinearities of the converter.

Jitter transformations in measurement instruments and discrepancies between measurement results

IEEE International Conference on Test, 2005., 2005

Jitter measurement with different time domain instruments (TDI) have been extensively studied in numerous works. These works covered different measurement instruments including equivalent-time (ETO) or sampling and real-time oscilloscopes (RTO), time interval analyzers (TIA), etc. However, in the published papers there is a lack of analysis of jitter transformations in different TDIs. Some publications pointed out discrepancies between measurement results carried out by different instruments, but the reasons of the discrepancies have not been explained. In this paper we research jitter transformations for typical jitter terms measurements with different instruments. It is demonstrated that jitter transformation depends both -on the measured jitter term, and the type of measurement instrument used. It is shown that jitter undergoes different transformations in different instruments. These transformation models are studied. The distinctions of both deterministic and random jitter (DJ and RJ respectively) transformations of measurements using various instruments are illustrated and analyzed. The experiments are discussed. The obtained results help to explain the discrepancies between different TDI measurement results and establish correct jitter measurement methodology.

STUDY OF THE RANDOM NOISE TEST OF ANALOG-TO-DIGITAL CONVERTERS

Metrology and Measurement Systems, 2009

An exact expression for the expected value of the mean square difference of the two data sets acquired during the IEEE 1057 Standard Random Noise Test of analog to digital converters is derived. This expression can be used to estimate exactly the amount of random noise present which is an improvement over the heuristically derived estimator suggested in the standard. A study of the influence of stimulus signal amplitude and offset on the existing estimator is carried out.