Atomic and nuclear analytical methods : XRF, Mossbauer, NAA and Ion-Beam Spectroscopic Techniques (original) (raw)
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Foreword of the Fifth Symposium on Nuclear Analytical Chemistry (NAC-V)
Journal of Radioanalytical and Nuclear Chemistry, 2014
The Fifth Symposium on Nuclear Analytical Chemistry (NAC-V) was organized at BARC, Mumbai during January 20-24, 2014 with more than 300 participants. It was sponsored by the Board of Research in Nuclear Sciences, Department of Atomic Energy (DAE), India and organized in cooperation with the IAEA and coorganized by the IANCAS. A total of 240 contributed abstracts along with 27 invited talks and 10 invited short talks were presented in 15 technical sessions. Selected 54 full papers of NAC-V have been accepted after review for publication in special issue of JRNC. Keywords NAC-V Á Foreword Á Technical program Á JRNC publications Chemical characterization of materials is the most important step of chemical quality control (CQC) and conventional wet chemical as well as spectrochemical techniques are routinely used for this purpose. But these techniques need chemical dissolution of samples, which is tedious and needs special care in many cases while dealing trace and sub-trace elements as it is not free from reagent blanks. Besides, solid samples like metals and alloys, glass and ceramics that are difficult for chemical dissolution need to be analyzed by suitable non-destructive methods and capable of simultaneous multielement determination at major to sub-trace concentration levels. Nuclear Analytical Techniques (NATs) meet these requirements. Horizons of NATs expanded by leaps and bounds with the availability of nuclear reactors, particle accelerators, rapid development in semiconductors & electronics and hand-held devices. NATs find applications in all branches of science and technology due to their properties like simultaneous multielement capability, inherent accuracy, precision and selectivity. Neutron and proton based techniques in conjunction with high resolution gamma-ray spectrometry are capable of determining almost all the elements from hydrogen to uranium. NATs can also be effectively employed for nondestructive determination of trans-uranium elements. Techniques like activation analysis using neutrons (NAA and PGNAA), charge particles like proton and alpha (CPAA) and photon (PAA), ion beam analysis (PIXE, PIGE, RBS and NRA) and X-ray Fluorescence (XRF, EDXRF and TXRF) are extensively used in various R&D programs as well as for material characterization in nuclear technology. Department of Atomic Energy (DAE), India is one of the leaders in developing and deploying NATs using neutrons, charge particles and photons as well as c-ray spectrometry and neutron well coincidence counting (NWCC) for characterization of materials often non-destructively that are important for nuclear technology. In view of continuous developments, it is appropriate to periodically review the progress made and evolve strategies to identify further areas of development and unique applications of radiotracers, radiations, and NATs.
Foreword of the 4th International Symposium on Nuclear Analytical Chemistry (NAC-IV)
Journal of Radioanalytical and Nuclear Chemistry, 2012
About 300 delegates from various units of DAE & Academic Institutes in India and 27 overseas delegates from 13 different countries participated in NAC-IV. Dr. Srikumar Banerjee, then Chairman of the Atomic Energy Commission (AEC) and Secretary, DAE, Government of India, inaugurated NAC-IV and Dr. R. K. Sinha, Chairman, AEC (then Direcor, BARC) presided over the inaugural session. Dr. Banerjee in his keynote address spoke about some interesting applications of analytical techniques in general and the role of nuclear analytical techniques (NATs) in particular in both R&D and nuclear reactor technology. Dr. Sinha emphasized the role of different NATs including neutron activation analysis (NAA) and prompt gamma ray NAA (PGNAA) in various programs of BARC and DAE, and also gave a brief account of the nuclear analytical facilities at BARC. Dr. Banerjee released the Book of Abstracts of NAC-IV and Dr. Sinha released the IANCAS Special Bulletin. Dr. A. V. R. Reddy, Head, Analytical Chemistry Division, BARC, and Convener, organizing Committee and Co-Chairman of the NAC-IV Technical Committee welcomed the delegates and outlined the theme of NAC-IV. Dr. V. Venugopal, Chairman of NAC-IV and then Director, Radiochemistry and Isotopes (RC&I) Group, BARC, emphasized that NATs using reactor and accelerator facilities were very important to obtain results with high precision and accuracy. Prof. A. Chatt of Dalhousie University, Canada, President of the NAC symposia series as well as the Co-Chairman of the NAC-IV Technical Committee, gave a brief account of the main objectives of these symposia. He informed that the Journal of Radioanalytical and Nuclear Chemistry (JRNC), has agreed to publish the peer-reviewed full papers of NAC-IV in two issues of JRNC. Dr. R. Acharya, RCD, BARC and Secretary of NAC-IV proposed a vote of thanks. The scope of NAC-IV included conventional and prompt gamma-ray activation analysis, alpha, X-ray & gamma-ray spectrometry, nuclear analytical chemistry in nuclear fuel cycle, nuclear track techniques, nuclear probes and ion beam analysis techniques, radioisotope tracer methodologies, speciation studies, QA/QC in measurements, applications of NATs to archaeological, biological, environmental, geological, industrial, nutritional, nuclear and pharmaceutical materials, nuclear forensics and safety studies. The technical program consisted of 30 invited talks
Analytical Chemistry in Nuclear Technology
Science, 1964
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This paper presents the results of an experimental study of three samples containing various elements in the near-surface layers. The depth profiles of all the elements of different atomic masses from hydrogen to silver were investigated by Rutherford Backscattering Spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA). The experiments were performed by using the low-energy (about 2 MeV) 4He+ ion beams. The obtained results demonstrate the possibility of the RBS and ERDA methods in the investigation of depth profiles of any mass element with an atomic concentration of about 0.01 at.% and a depth resolution close to 10 nm.
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This report was prepared as an account of work sponsored by the United States Government. Neither the United States nor the United States Department of Energy nor any of their employees, nor any of their contractors, subcontractors or their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness or usefulness of any infomation, apparatus, product or process disclosed, or represents that its use would not infringe privately-owned rights.
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This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness. or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process. or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof. Research supported by the United States Department of Energy under contract DEFG05-87ER40361. CONTENTS I. INTRODUCTION 1 I1. SCIENTIFIC RESULTS 1I.A.
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This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, make any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof. DISCLAIMER Portions of this document may be illegible in electronic image products. Images are produced from the best available original document.