Interface and structural disorder changes in Se/CdSe multilayers (original) (raw)

Philosophical Magazine Part B, 1995

Abstract

The constant photocurrent method and small-angle X-ray diffraction have been used in order to study the changes in the interfaces of Se/CdSe multilayers as well as in the structural disorder of CdSe sublayers after annealing. An improvement of the interface quality accompanied by a decrease of the Urbach edge parameter EU has been found after annealing the multilayers with sublayer

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