Transmission electron microscopic analysis of microstructural features in magnetic recording media (original) (raw)

IEEE Transactions on Magnetics, 1993

Abstract

A study of the relationships between the microstructure and magnetic properties of cobalt alloy magnetic thin films and chromium underlayers deposited onto circumferentially textured NiP/Al substrates is presented. The variation of the chromium microstructure as a function of argon pressure and substrate temperature during sputtering is analyzed using high-resolution scanning electron microscopy and transmission electron microscopy (TEM). This combination shows

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