Quantitative Characterization of Vertically Aligned Multi-Walled Carbon Nanotube Arrays Using Small Angle X-Ray Scattering (original) (raw)

Abstract

We have used small angle X-ray scattering (SAXS) to quantitatively characterize the morphology of vertically aligned (VA) multiwall carbon nanotube (MWCNT) arrays. We examined the extent of alignment of MWCNTs in terms of order parameter by analyzing SAXS intensity as a function of azimuthal angle. The SAXS measurements at different heights of CNT arrays from the substrate reveal two distinct morphologies and increasing alignment. We are able to quantitatively characterize a real variation in CNT diameters of the VA-MWCNTs through model fitting of the SAXS spectra. It found that the average CNT diameter increases with increasing distance from the substrate.

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