Quantitative performance measurements of bent crystal Laue analyzers for X-ray fluorescence spectroscopy (original) (raw)
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Journal of Synchrotron Radiation, 2020
A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF-XAFS), which has a long X-ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X-ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film with high sensitivity was obtained. Although range-extended XAFS was expected by the rejection of Au fluorescence arising from the Au substrate, a small glitch was found in the AuL3edge because of the sudden change of the complex refraction index of the Au substrate at the Au edge. This abnormal spectrum feature can be removed by reflectivity correction using Au foil absorption data. BCLA combined...
2007
An apparatus has been developed, which enables us to monitor both x-ray fluorescence yield (XFY) and conversion electron yield (CEY) from a sample. The apparatus has been installed to the BL11 of HSRC, and its basic performance has been evaluated. The detection limit of X-ray fluorescence analysis is 1.5 ppm for Ca and 6.6 ppm for S when the incident x-ray energy is optimized just above the absorption edge energy. The probing depth of the CEY method is estimated to be 4.0 nm for Ag thin films around Ag LIII edge while the escape depth of the x-ray fluorescence is more than 1 mum The near surface sensitivity of the CEY is advantageous for XAFS measurements because x-ray fluorescence mode may suffer self-absorption-effects.