An SPC artifact for automated solder joint inspection (original) (raw)

Automatic visual solder joint inspection

IEEE Journal on Robotics and Automation, 1985

An approach is described for the automatic inspection of solder joints on printed circuit boards. Common defects are identified in solder joints and a joint is classified as being good or belonging to one of the defective classes. The motivation for this classification is not just the detection of defective joints, but the desire to automatically take corrective action on the assembly line. The features used for classification are based on characteristics of intensity surfaces. It is shown that features derived fromfacets and Gaussian curvature are effective in the classification of solder joints using a minimum-distance classification algorithm. Class separation plots are shown to be useful for quickly studying individual effectiveness of a feature or pair of features in classification. Results show the efficacy of the described approach.

Design of automatic vision-based inspection system for solder joint

Purpose: Computer vision has been widely used in the inspection of electronic components. This paper proposes a computer vision system for the automatic detection, localisation, and segmentation of solder joints on Printed Circuit Boards (PCBs) under different illumination conditions. Design/methodology/approach: An illumination normalization approach is applied to an image, which can effectively and efficiently eliminate the effect of uneven illumination while keeping the properties of the processed image the same as in the corresponding image under normal lighting conditions. Consequently special lighting and instrumental setup can be reduced in order to detect solder joints. These normalised images are insensitive to illumination variations and are used for the subsequent solder joint detection stages. In the segmentation approach, the PCB image is transformed from an RGB color space to a YIQ color space for the effective detection of solder joints from the background. Findings: The segmentation results show that the proposed approach improves the performance significantly for images under varying illumination conditions. Research limitations/implications: This paper proposes a front-end system for the automatic detection, localisation, and segmentation of solder joint defects. Further research is required to complete the full system including the classification of solder joint defects. Practical implications: The methodology presented in this paper can be an effective method to reduce cost and improve quality in production of PCBs in the manufacturing industry. Originality/value: This research proposes the automatic location, identification and segmentation of solder joints under different illumination conditions.

Solder joint inspection with multi-angle imaging and an artificial neural network

2008

Machine vision has been widely deployed in many industrial applications. However, for solder joint inspection, it has yet to reach the desired maturity level. This paper presents a new inspection methodology using images from both orthogonal and oblique viewing directions to the solder joint. The oblique view was made possible through a mirror pyramid. Image capturing and selection of the soldered region were done manually, but could be automated if the positional coordinates were known. Combined orthogonal and oblique gray-level images at the pixel level were directly input to an artificial neural network (ANN) for processing, eliminating the need to determine heuristic features. Learning vector quantization architecture was used as the classifier. This study was focused on geometry-related joint defects, namely, excess and insufficient. Comparisons show that the oblique view provides more useful information compared to the orthogonal view. The experimental results indicate that the proposed system has an improved recognition rate and good resilience to noise.

Towards Automatic Optical Inspection of Soldering Defects

2018 International Conference on Cyberworlds (CW), 2018

This paper proposes a method for automatic image-based classification of solder joint defects in the context of Automatic Optical Inspection (AOI) of Printed Circuit Boards (PCBs). Machine learning-based approaches are frequently used for image-based inspection. However, a main challenge is to manually create sufficiently large labeled training databases to allow for high accuracy of defect detection. Creating such large training databases is time-consuming, expensive, and often unfeasible in industrial production settings. In order to address this problem, an active learning framework is proposed which starts with only a small labeled subset of training data. The labeled dataset is then enlarged step-by-step by combining Kmeans clustering with active user input to provide representative samples for the training of an SVM classifier. Evaluations on two databases with insufficient and shifting solder joints samples have shown that the proposed method achieved high accuracy while requiring only minimal user input. The results also demonstrated that the proposed method outperforms random and representative sampling by ~ 3.2% and ~ 2.7%, respectively, and it outperforms the uncertainty sampling method by ~ 0.5%.

Visual Inspection Algorithms for Printed Circuit Board Patterns a Survey

1993

The importance of the inspection process has been magnified by the requirements of the modern manufacturing environment. In elec tronics mass-production manufacturing facilities, an attempt is often made to achieve 100 % quality assurance of all parts, subassemblies, and finished goods. A variety of approaches for automated visual inspection of printed circuits have been reported over the last two decades. In this survey, algorithms and techniques for the automated inspection of printed circuit boards are examined. A classification tree for these algorithms is presented and the algorithms are grouped according to this classification. This survey concentrates mainly on image analysis and fault detection strategies, these also include the state-of-the-art techniques. Finally, limitations of current inspection systems are summarized.

Automated Inspection System for Assembled Printed Circuit Board Using Machine Vision

Soft Computing Research Society eBooks, 2023

The perfect Printed Circuit Board (PCB) plays a very important role in every electronic device as well as in automation systems. So, it is very important to find defects in the PCB before installing it to any system or any device. However, PCB Manufacturers use various inspection systems in the process of manufacturing PCBs for detecting various types of defects in the PCB. In this article, we present the Automated assembled PCB Inspection System. This system finds defects such as missing components and improper position of its components by using the Pattern matching Technique where a good known score of template image is matched with the score of the test image. This system gives results at each inspection within 10 Seconds and the result given by this system are passed or fail in the form of an array sheet. This automated inspection system is created by using NI Vision Builder AI and NI LabVIEW technology. Ni Vision Builder AI has been used to create the algorithm. And NI LabVIEW has been used to create the application.

Automated inspection of printed circuit boards through machine vision

Computers in Industry, 1996

This paper introduces the development of an automated visual inspection system for printed circuit boards (PCBs). It utilizes an elimination-subtraction method which directly subtracts the template image from the inspected image, and then conducts an elimination procedure to locate defects in the PCB. Each detected defect is subsequently classified into one of the seven defect types hy three indices: the type of object detected, the difference in object numbers, and the difference in background numbers between the inspected image and the template. Finally, a 256 X 240 PCB image was tested to show the effectiveness of this system.

2-Automated inspection of printed circuit boards through machine vision

This paper introduces the development of an automated visual inspection system for printed circuit boards (PCBs). It utilizes an elimination-subtraction method which directly subtracts the template image from the inspected image, and then conducts an elimination procedure to locate defects in the PCB. Each detected defect is subsequently classified into one of the seven defect types hy three indices: the type of object detected, the difference in object numbers, and the difference in background numbers between the inspected image and the template. Finally, a 256 X 240 PCB image was tested to show the effectiveness of this system. Keywords: Machine vision; Automated inspection; Printed circuit board 0166-3615/96/$15.00 0 1996 Elsevier Science B.V. All rights reserved SSDI 0166-3615(95)00063-l

A Parallel-Structure Solder Paste Inspection System

IEEE-ASME Transactions on Mechatronics, 2009

In this paper, we present an innovative design of a solder paste inspection system that can be practically integrated into existing solder paste printing machines. Since solder paste inspection systems usually occupy a large vertical space, we designed a mirror box that can redirect the transmission of fringe patterns. In this way, a new parallel-structure solder paste inspection system with a significant reduction in the vertical constraint is developed. We also developed a hybrid weighting algorithm that applies the distance and fringe contrast to acquire the height of solder pastes. Furthermore, we developed an algorithm that generates the 2-D image from the fringe pattern images during the four-step algorithm. It reduces the time required for solder paste inspection compared to traditional approaches that use special lighting systems to create the 2-D image. Based on the results of the height acquisition algorithm, 2-D and 3-D solder paste inspections are performed. Experimental results show that our system can inspect a 20 mm × 20 mm printed circuit board area within 2 s to detect common 2-D and 3-D defects, and the maximum standard deviation for the average height is 3 µm.