Development of a digital holographic microscopy system integrated with atomic force microscope (original) (raw)

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 2011

Abstract

Atomic Force Microscope (AFM) imaging, due to the scanning method of recording, requires significant recording time for examination of wide sample area. In contrast, digital holographic microscopy (DHM), owing to the wide-field method, allows recording of the hologram in very fast rate which could be numerically analyzed to reveal surface of the sample with axial resolution at the nanometer scale.

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