A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique (original) (raw)

ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153)

Abstract

In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high

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