46 Visualization and Natural Control Systems for Microscopy (original) (raw)

Scanning Electron Microscopy Based Manipulation and Characterisation of Nano-Scale Objects

IFAC Proceedings Volumes, 2006

Two scanning electron microscopy (SEM) based devices for positioning, manipulation and imaging at the nano-scale have been developed. The control and vision system is based on both a commercial scanning probe microscopy (SPM) controller and a client-server approach to ensure that nanopositioning and SEM image processing are executed in real-time. The evaluation of the two devices has been performed by implementing three different applications: (i) attachment of carbon nanotubes on SPM tips, (ii) investigation of mechanical properties of nanowires and (iii) tensile strength measurements for focused electron beam deposits.

Controlled manipulation of molecular samples with the nanoManipulator

IEEE/ASME Transactions on Mechatronics, 2000

Making further advances in such diverse problems as building more powerful computers, measuring material properties of biological samples or exploring fundamental physical laws on the atomic level requires gaining access the to the nanoworld. The nanoManipulator system adds a virtualreality interface to an atomic-force microscope (AFM), thus providing a tool that can be used by scientists to image and manipulate nanometer-sized molecular structures in a controlled manner. As the AFM tip scans the sample, the tipsample interaction forces are monitored which, in turn, can yield information about the frictional, mechanical, material and topological properties of the sample. Computer graphics are used to reconstruct the surface for the user, with color or contours overlaid to indicate additional data sets. Moreover, a force feed-back stylus, which is connected to the tip via software, allows the user to directly interact with the macromolecules. This system is being used to investigate carbon nanotubes, DNA, fibrin, adeno-and tobacco-mosaic virus. Nanotubes have been bent, translated and rotated to understand their mechanical properties and to investigate friction on the molecular level. Using AFM lithography in combination with the nanoManipulator, the electromechanical properties of carbon nanotubes are being investigated. The rupture forces of DNA and fibrin fibers have been measured and the elastic moduli of viruses are being studied. It is now also possible to insert this system into a Scanning Electron Microscope (SEM) which provides the user with continuous images of the sample, even while the AFM tip is being used for manipulations. Investigators are invited to apply to use the system as described on the web at http://www.cs.unc.edu/Research/nano/doc/biovisit.html.

Bringing the nanolaboratory inside electron microscopes

IEEE Nanotechnology Magazine, 2008

A A NANOLABORATORY IS ONE OF THE SYSTEMS TO REALIZE VARIOUS nanoscale fabrications and assemblies to develop novel nanodevices to integrate borderless technologies based on a nanorobotic manipulation system. We have presented the nanolaboratory inside electron microscopes including a transmission electron microscope (TEM), scanning electron microscope (SEM), and environmental-SEM (E-SEM) for three-dimensional (3-D) and real-time nanomanipulation, nanoinstrumentation, and nanoassembly.

Extensible visualizer for atomic force microscopy

1990

Atomic Force Microscopy (AFM) is a method for measuring the topological displacement of a microscopic surface. To create a displacement map of the surface, a cantilever with a very sharp tip is moved over the surface, while measuring the cantilever's vertical displacement. The surface position is adjusted horizontally to ensure the tip does not scratch through the material. An important problem in AFM is that the tips are never perfect so the output image is subject to error and distortion. For reasons described in this document, the nature of the contact means that it is often impossible to remove this distortion. This makes surface analysis more difficult as researchers may be unsure whether the source of a particular surface feature is due to the underlying surface topology or a distortion due to an imperfect tip. This work proposes and documents the development of an application that can be used to simulate the distortion effects caused by the interaction of the tip and the sample. This allows researchers to investigate a wide variety of tip-surface combinations to visually examine the kinds of distortion caused in order to derive the origin of the surface features. A selection of tools such as a probe and an area tool have been implemented to allow data extraction from the output surface, and new tools may be added easily to the application. To aid the analysis process, a 3D representation of the output was added to the application, allowing a researcher to see the surface from an angle of their choosing. This surface can be analysed quantitatively with the application's extensible toolset. With the successful completion of this application, it was extended to allow user-defined distortion filters to be added to the application, simulating any phenomena required. Not limited to AFM, this is of great use to other measurement systems subject to distortion effects such as optical or magnetic microscopy.

Visualizing Nature at Work from the Nano to the Macro Scale

Nanobiotechnology, 2005

Visalizing the structure and dynamics of proteins, supramolecular assemblies, and cellular components are often key to our understanding of biological function. Here, we focus on the major approaches in imaging, analyzing, and processing biomedical data ranging from the atomic to the macro scale. Relevant biomedical applications at different length scales are chosen to illustrate and discuss the various aspects of data acquisition using multiple modalities including electron microscopy and scanning force microscopy. Moreover, powerful scientific software is presented for processing, analyzing, and visualizing heterogeneous data. Examples of using this software in the context of visualizing biological nano-machines are presented and discussed.

Augmented reality user interface for nanomanipulation using atomic force microscopes

2004

Abstract. Models for a user interface for nanomanipulation using atomic force microscopes (AFM) are presented. Nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations and are fed back to the user. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the AFM-tip penetrates the surface.

NanoMi: An Open Source Electron Microscope Hardware and Software Platform

Micron, 2022

We outline a public license (open source) electron microscopy platform, referred to as NanoMi. NanoMi offers a modular, flexible electron microscope platform that can be utilized for a variety of applications, such as microscopy education and development of proof-of-principle experiments, and can be used to complement an existing experimental apparatus. All components are ultra-high vacuum compatible and the electron optics elements are independent from the vacuum envelope. The individual optical components are mounted on a 127 mm (5-inch) diameter half-pipe, allowing customizing of electron optics for a variety of purposes. The target capabilities include SEM, TEM, scanning TEM (STEM), and electron diffraction (ED) at up to 50 keV incident electron energy. The intended image resolution in SEM, TEM and STEM modes is ≈ 10 nm. We describe the existing components and the interfaces among components that ensure their compatibility and interchangeability. The paper provides a resource for those who consider building or utilizing their own NanoMi.

Haptics and graphic analogies for the understanding of atomic force microscopy

International Journal of Human-Computer Studies, 2013

This paper aims to evaluate the benefits of using virtual reality and force-feedback to help teaching nanoscale applications. We propose a teaching aid that combines graphic analogies and haptics intended to improve the grasp of non-intuitive nanoscale phenomena for people without prior knowledge of nanophysics. We look specifically at the most important nanophysical phenomenon, namely, the behavior of the probe of an Atomic Force Microscope (AFM) as it approaches a sample. The results from experiments carried out with 45 students indicate that a "magnet-spring" analogy helped beginners to establish the link between the behavior of a probe and its force-distance curve. The addition of haptic feedback increased focus about forces and improved the interpretation of the effect of cantilever stiffness. Haptic feedback and the analogical representation were very much appreciated by the subjects and had an impact on the construction of a mental model. Taken together, our results show a positive influence of using haptic feedback and graphic analogies, especially when students are first exposed to the notions that are in effect at the nanoscale.