The influence of rinsing period on the structural and optical properties of ZnO thin films (original) (raw)
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Optical and Structural Properties of ZnO Thin Films Fabricated by SILAR Method
International Journal of Innovative Research in Science, Engineering and Technology, 2014
A novel and simple chemical route was used for the deposition of ZnO thin film from aqueous solution of zinc-ammonia complex, integrating the merits of successive ionic layer adsorption and reaction (SILAR) and chemical bath deposition methods. ZnO thin films on glass substrates were deposited with the precursor of zincammonia complex. Characterization techniques of XRD, SEM, EDAX and DRS are used to characterize ZnO thin films. X-ray diffraction study show that the film prepared in this work exhibits good crystallinity with the hexagonal wurtzite crystalline structure and the preferential orientation along (0 0 2) plane, with a texture coefficient value of ~2.56, average crystallite size of 28.92 nm and with lattice constants a = b = 3.257 Å, c = 5.215 Å. EDAX spectrum indicates that the film consists of zinc and oxygen elements. The optical band gap energy of the thin films is calculated from optical absorption spectrometry using DRS data and the value was found to be direct allowed transition ~3.22 eV.
ACS Omega
Here, we report the effect of the substrate, sonication process, and postannealing on the structural, morphological, and optical properties of ZnO thin films grown in the presence of isopropyl alcohol (IPA) at temperature 30−65°C by the successive ionic layer adsorption and reaction (SILAR) method on both soda lime glass (SLG) and Cu foil. The X-ray diffraction (XRD) patterns confirmed the preferential growth thin films along (002) and (101) planes of the wurtzite ZnO structure when deposited on SLG and Cu foil substrates, respectively. Both XRD and Raman spectra confirmed the ZnO and Cu-oxide phases of the deposited films. The scanning electron microscopy image of the deposited films shows compact and uniformly distributed grains for samples grown without sonication while using IPA at temperatures 50 and 65°C. The postannealing treatment improves the crystallinity of the films, further evident by XRD and transmission and reflection results. The estimated optical band gaps are in the range of 3.37−3.48 eV for the as-grown samples. Our experimental results revealed that high-quality ZnO thin films could be grown without sonication using an IPA dispersant at 50°C, which is much lower than the reported results using the SILAR method. This study suggests that in the presence of IPA, the SLG substrate results in better c-axis-oriented ZnO thin films than that of deionized water, ethylene glycol, and propylene glycol at the optimum temperature of 50°C. Air annealing of the samples grown on Cu foils induced the formation of Cu x O/ZnO junctions, which is evident from the characteristic I−V curve including the structural and optical data.
IOSR Journal of Applied Physics, 2012
ZnO and Al-doped ZnO (AZO) thin films were grown by Successive Ionic Layer Adsorption and Reaction (SILAR) method on a glass substrate from sodium zincate solution. Doping was achieved with controlled introduction of aluminum chloride. The technique involved multiple dipping of the substrate in an aqueous solution of sodium zincate kept at room temperature and a hot water bath kept at 95 o C in which ZnO and AZO thin films were synthesized at 0.125M and 0.25M of sodium zincate (Na2ZnO2) where 100 and 200 dippings were performed for each. The thickness of the layers were determined using Metler PB303 digital balance and a Radicon 10 mini- diffractometer (XRD) for the structural characterization while optical characterization was achieved with the use of a Jenway 6405 UV-Vis Spectrophotometer. The results revealed (002) peaks for ZnO thin films and (112) peaks for AZO thin films. Also the transmittances of the ZnO films were higher than those of AZO while AZO films have higher absorba...
Optical and structural properties of thin films of ZnO at elevated temperature
Zinc oxide (ZnO) thin films were prepared on glass substrate by sol-gel dip-coating method. The paper presents the properties of zinc oxide thin films deposited on soda-lime-glass substrate via dip-coating technique, using zinc acetate dehydrate and ethanol as raw materials. The effect of withdrawal speed on the crystalline structure, surface morphology and optical properties of the thin films has been investigated using XRD, SEM and UV-Vis spectrophotometer. X-ray diffraction study shows that all the films have hexagonal wurtzite structure with preferred orientation in (0 0 2) direction and transmission spectra showed highly transparent films with band gap ranging from 3.78 to 3.48 eV.
Structural Properties of Zno Thin Films Prepared Using Different Techniques
2016
In this work, zinc oxide (ZnO) thin film has been fabricated using sol-gel and thermal spray methods on glass substrate. To fabricate a ZnO solution which dipped on substrate and spin coating treatment, zinc acetate and triethanolamine (TEA) with NaOH were used as solvents and stabilizer materials, respectively. Structural properties of ZnO films have been studied, using X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD results show that the prepared films have a polycrystalline in nature. The referred orientation ZnO (002) has the lower grain size to be 9.9 and 8.3 nm for zinc acetate, triethanolamine (TEA) with NaOH of concentration ratio of 1:4 using spin coating and thermal spray respectively, which calculated using Debye Scherer's formula. SEM images are in agreement with the XRD results that films with zinc acetate and triethanolamine (TEA) with NaOH using spin coating have a rough surface, that make ZnO thin film a promising material to solar cells and o...
On the Optical and Structural Propeties of ZnO Thin Films Synthesized by a Sol-Gel Technique
Zinc oxide (ZnO) films were prepared by an alternative route to the sol-gel process and their structural and optic properties carefully investigated. The deposition of the films was carried out on glass substrates by using a dip-coating technique. Zinc acetate dihydrate was used as inorganic precursor. This compound was first dissolved in ethanol and nitric acid. The obtained solution was then mixed with a citric acid and ethylenglycol, which were previously dissolved. XRD pattern con-firmed the hexagonal wurtzite structure of the synthesized material. Optical transmittance spectra showed absorption band at 3.3 eV. Scanning Electron Microscope (SEM) analysis showed excellent morphology of the samples with very flat sur-faces. Películas delgadas de ZnO fueron preparadas por una ruta alternativa a la técnica convencional de sol-gel. Las propiedades estructurales y ópticas de dichas muestras fueron cuidadosamente estudiadas. La deposición de las películas fue llevada a cabo sobre sustr...
Characterization of ZnO Thin Films Grown by SILAR Method
OALib, 2014
Zinc oxide (ZnO) thin films have been deposited using a SILAR (Successive Ionic Layer Adsorption and Reaction) technique, which is based on the alternate dipping of substrate in the solution and distilled water. The thin films were grown on copper, silicon and glass substrates. The precursors for ZnO films were diluted aqueous solution ZnSO4 complexed with NH3. The films were investigated by X-ray diffraction, scanning electron microscopy, XPS spectroscopy and spectrophotometer. XRD measurement showed that the films were crystallized in the wurtzite phase type with preferred orientation (002). X-ray photoelectron spectroscopy (XPS) was used to monitor changes in oxidation state of ZnO thin films. The XPS peaks of the O1s, Zn2p3/2 and Zn2p1/2 were used for studding the ZnO film. The results of influence of different parameters of SILAR method on phase structure, surface morphology, and optical properties are studied and discussed.
A research on the Deposition and Characterization of ZnO Thin Films by Chemical Bath Deposition Technique using Ammonia (NH 3 ) as a complexing agent. Thin films of ZnO are deposited onto glass substrates at room temperature for 5hours. The optical properties of the films were measured using Double Beam UV-Spectrophotometer with serial number UV061514, Rutherford Back Scattering Spectroscopy (RBS) analysis revealed that the thin filmshave percentage ratios of the elements of Zn/O, 47/53 as annealed for 3hours at the temperature of 250⁰C and Zn/O, 48.8/51.2as annealed for 1hour at the temperature of 150⁰C. The thicknesses are 80nm for 3hours and 150nm for 1hour asannealed samples at 250⁰C and 150⁰C respectively. It was found that ZnO thin films exhibits n-type conduction. Optical band gap values of the twosamples are 3.1±0.05eV as annealed for 3hours and 3.3±0.05eV as annealed for 1hour with an average of 3.2±0.05eV. Other optical properties calculated from transmittance using appropriate equations are absorbance, reflectance, band gap , absorption coefficient, optical conductivity, refractive index and extinction coefficient.
Morphological, Structural and Optical Properties of ZnO Thin Films Deposited by Dip Coating Method
Materials Research-ibero-american Journal of Materials, 2016
Zinc oxide (ZnO) thin films were deposited on glass substrat by dip coating technique. The effects of sol aging time on the deposition of ZnO films was studied by using the field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), and optical transmission techniques. The morphology of the films strongly depends on preparation route and deposition technique. It is noteworthy that films deposited from the freshly prepared solution feature indistinct characteristics; had relatively poor crystalline quality and low optical transmittance in the visible region. The increase in sol aging time resulted in a gradual improvement in crystallinity (in terms of peak sharpness and peak intensity) of the hexagonal phase for all diffraction peaks. Effect of sol aging on optical transparency is quite obvious through increased transmission with prolonged sol aging time. Interestingly, 72-168 h sol aging time was found to be optimal to achieve smooth surface morphology, good crystallinity and high optical transmittance which were attributed to an ideal stability of solution. These findings present a better-defined and more versatile procedure for production of clean ZnO sols of readily adjustable nanocrystalline size.
2020
This study carried out on the effect of precursor concentration and annealed substrate temperature on the crystal structure, electronic and optical properties of ZnO thin film. An aqueous solution of Acid Nitrite was used as precursors and its concentration was varied from 0.1 M to 0.4 M. The ZnO thin film was deposited on the glass substrate by Spray Pyrolysis Deposition and annealed with different temperature from 300 o C to 600 o C. The crystal structure, electronic and optical properties were investigated by Scanning Electron Microscopy (SEM), X-ray diffraction (XRD) and UV-Spectrometer. XRD result showed that all thin films have amorphous hexagonal wurtzite crystalline. Particle sizes ranging from 21.83 to 43.67 nm were calculated through Debye-Scherer Method. It showed that the concentration of the precursor had slightly impact on the particle size. Meanwhile, the increase in particle size with increasing annealed temperature is found to be gradual. The average transparent of ...