Using Accelerated Tests and Field Data to Predict Module Reliability and Lifetime (original) (raw)

2008

Abstract

ABSTRACT: This paper discusses how BP Solar utilizes long term module exposure data, field return data and accelerated stress tests to determine module lifetimes, expected failure rates and to identify failure mechanisms. A small number of modules have been deployed outdoors for long time periods with periodic measurements of performance in order to establish degradation rates. Field returns are reviewed for both overall return rates and to identify the failure mechanism that caused the return. Accelerated stress tests are utilized to evaluate commercial products and all new materials, processes and designs against known failure mechanisms. In order to ensure the 25 year warranty offered on most crystalline silicon products, BP Solar has designed an extended accelerated test sequence. This paper presents results of this test sequence as applied to BP Solar modules as well as to modules from nine other PV manufacturers.

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