Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method (original) (raw)
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Unlike the Vectorial Network Analyser, the Nonlinear Vectorial Network Analyser imposes a wideband intermediate frequency (IF) detection (a few kHz instead of Hz). In this paper, the influence of the resulting signal-to-noise degradation on the calibration accuracy is analysed. The statistical properties of a standard calibration are compared to a stochastically founded method based on real experimental data.
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Vector Network Analyzers (VNA) measure tested circuits in the frequency domain but their frequency range does not include DC. When VNAs are used for time-domain measurements, the proper transformation requires the measured DC value as well. Under certain conditions extrapolation of the DC response can be incorrect, what causes incorrect time domain response, too. This paper presents a solution to this problem.
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The present paper aims to develop a uniform procedure of estimating uncertainty components in VNA measurements whether in complex or linear units. The individual response of each uncertainty components have been studied in the frequency range 1 to 18 GHz, which are applicable for one-port and two-port measurements. The Vector network analyser (VNA) measurements are performed to assign an overall uncertainty for the respective measuring parameter in terms of comp lex and linear units for coaxial step attenuator, fixed attenuator and mis match. These measurements are then verified through the primary and transfer standards of the attenuation and impedance parameters and thus the traceability of the VNA measurements is established. Finally, the outcome of co mplete study has been presented as VNA measurements based new calibrat ion and measurement capabilit ies (CM Cs) for NPL, India. It has shown that the final combined uncertainty is found same or nearby by obtaining from uncertainty components either in complex or in linear units. Thus, this paper reports the estimation of VNA measurement uncertainties for various parameters as per the requirements of IS O/IEC 17025:2005 standard.