Reactively Sputtered Cu2ZnTiS4 Thin Film as Low-Cost Earth-Abundant Absorber (original) (raw)

Cu 2 ZnTiS 4 thin films have been deposited on glass by the reactive cosputtering technique with high-purity ZnS and Cu and Ti metals as targets and H 2 S as reactive gas. Cu 2 ZnTiS 4 thin films were obtained at various temperatures and H 2 S flows and were annealed in H 2 S atmosphere. The structural, morphological, and optical properties of the Cu 2 ZnTiS 4 thin films were examined by scanning electron microscopy, energy-dispersive spectroscopy, x-ray diffraction (XRD) analysis, and ultraviolet-visible (UV-Vis) spectroscopy. Agglomeration was found to increase with increasing temperature. The XRD peaks of the Cu 2 ZnTiS 4 thin films were consistent with those of Cu 2 ZnSnS 4. Furthermore, the optical bandgaps of the Cu 2 ZnTiS 4 films were lower than those of conventional Cu 2 ZnSnS 4 thin films.