Characterization of Si Nanocrystals (original) (raw)

Fundamentals, Synthesis and Applications, 2010

Abstract

In this chapter, we review and discuss some of the widely used analytical and optical methods for characterizing Si nanoclusters in various matrices. Universal diagnostic techniques such as transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), photoluminescence (PL), atomic force microscopy (AFM), Raman spectroscopy (RS), Fourier transform infrared (FTIR) spectroscopy, and X-ray diffraction (XRD) are commonly used directly or indirectly to understand various features of ...

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