Impact of Bias Temperature Instability on Soft Error Susceptibility (original) (raw)
2015, IEEE Transactions on Very Large Scale Integration (VLSI) Systems
AI-generated Abstract
The paper investigates the impact of bias temperature instability (BTI) on the soft error susceptibility of microelectronic circuits. It highlights the growing concern of soft errors due to single event transients (SETs) as semiconductor technology scales down, leading to reduced noise margins. By analyzing the interaction between BTI and SETs, the research presents a time-dependent model of soft error rates, emphasizing the need to consider the dynamic performance degradation caused by aging mechanisms in modern ICs.
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