Quantification of second phase nanoparticles in AA 7075-T651 using AFM (original) (raw)

Abstract

Amplitude modulated atomic force microscopy (AM-AFM), also known as tapping-AFM, has been applied to the quantification of second nano-phases in the AA 7075-T651 aluminum alloy (GP-zones, eta’ and eta phases). Specialized image analysis software was used to obtain statistical information from phase contrast AFM images. The method here described drastically reduces the effort required for sample preparation, contrasted with the one demanded by transmission electron microscopy, minimizing sample handling and reducing the likelihood of losing relevant information due to sample manipulation. The experimental results are compared with those reported by other authors using transmission electron microscopy, traditionally used for nanoparticle quantification.

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