Characteristic Impedance Deembeding of Printed Lines with the Probe-Tips Calibrations (original) (raw)

32nd European Microwave Conference, 2002, 2002

Abstract

ABSTRACT The procedures allowing determination of the microstrip and CPW lines characteristic impedance are presented. The procedures are based on the measurement technique of two on-wafer line standards as presented by Carchon et al (1). An initial off-wafer LRM or TRL calibration is assumed. The formulation of the whole extraction problem in terms of the ABCD chain matrix allows us to omit the influence of a difference between complex characteristic impedances of both lines on the S-matrix asymmetry of the feeding transition. On the contrary, the AD-BC=1 condition of its chain matrix is not influenced by this effect. The next novelty lies in the modelling of the CPW-microstrip transition by a symmetric model. This allows to extract the characteristic impedance without using of any fixed transition model and takes automatically into consideration a distributed nature of the transition. The next feature is that a specific treatment of the measured standards enables to extract an equivalent position of the probe-tips along the line. In case of MCM-D different microstrip feed topologies have been analysed and the best possible one has been found.

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