Stochastic resonance in MEMS capacitive sensors (original) (raw)

Abstract

 Intrinsic noise processes are described by exponential autocorrelation function.  Noise effects are modeled as parametric perturbations causing frequency fluctuation.  Stochastic resonance occurs in MEMS capacitive sensors at sub-fundamental frequencies.  Noise variance and correlation rate control stochastic motion and sensor response.  Numerical case analyses of stochastic resonance in MEMS cantilever response are given.

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  125. Vivek K Verma received his B.Sc. (Physics) in 2005 and M.Sc. (Electronics) from UIET CSJM University Kanpur, India in 2009. He is pursuing research for Ph.D. on stochastic resonance phenomena in nonlinear sensors at the Department of Physics, Faculty of Science, Banaras Hindu University, Varanasi, India.
  126. R D S Yadava received his B.Sc. (Honors), M.Sc. and Ph.D. in Physics in 1974, 1976 and 1981 respectively from the Banaras Hindu University, Varanasi, India. December 2005 onwards he is in teaching and research as Professor of Physics at Banaras Hindu University. Before that from October 1980-December 2005 he worked as R & D Scientist at the Solid State Physics Laboratory, Defence Research and Development Organization, Government of
  127. India, Delhi. His present research interests include: chemical sensors and sensors array based on surface acoustic wave and micro/nano cantilever devices, signal processing and pattern recognition for electronic nose; nonlinear dynamics of autonomous and coupled oscillator systems involving SAW and MEMS/NEMS resonators (particularly, parametric oscillations, bifurcation, chaos, noise, synchronization and stochastic resonance) for applications in chemical sensing and communication domains; and, modeling of self-propelled autonomous agents and swarm intelligence. During defense research and development association he worked on surface acoustic wave devices and systems for radar signal processing, SAW chemical sensors, mercury-cadmium-telluride semiconductors for infrared sensors, metal- oxide-semiconductor field effect devices, electrical percolation systems and fluctuation phenomena. For Ph.D. he worked on radiation blistering in solids.