Random access memory Research Papers (original) (raw)

... EMBEDDED SYSTEMS Mehdi Modarressi Computer Engineering Dept. Sharif University of Technology, Tehran, Iran modarressi@ce.sharif.edu Shaahin Hessabi Computer Engineering Dept. Sharif University of Technology, Tehran, Iran... more

... EMBEDDED SYSTEMS Mehdi Modarressi Computer Engineering Dept. Sharif University of Technology, Tehran, Iran modarressi@ce.sharif.edu Shaahin Hessabi Computer Engineering Dept. Sharif University of Technology, Tehran, Iran hessabi@sharif.edu ...

This article presents a new Fast Hash-based File Existence Checking (FHFEC) method for archiving systems. During the archiving process, there are many submissions which are actually unchanged files that do not need to be re-archived. In... more

This article presents a new Fast Hash-based File Existence Checking (FHFEC) method for archiving systems. During the archiving process, there are many submissions which are actually unchanged files that do not need to be re-archived. In this system, instead of comparing the entire ...

RAM adalah kependekan dari Random Access Memory. RAM merupakan sebuah perangkat keras atau hardware yang digunakan untuk menyimpan data sementara atau memori. Selain menyimpan data, fungsi RAM adalah untuk menyimpan berbagai jenis... more

RAM adalah kependekan dari Random Access Memory. RAM merupakan sebuah perangkat keras atau hardware yang digunakan untuk menyimpan data sementara atau memori. Selain menyimpan data, fungsi RAM adalah untuk menyimpan berbagai jenis instruksi program pada sebuah komputer. RAM merupakan memory utama yang merupakan jenis volatile memory, artinya data yang ada di RAM hanya akan bertahan saat ada arus listrik. Berbeda dengan cara kerja hardisk. Hardisk adalah non volatile memory. Disebut Random Access Memory karena dapat diakses secara acak. Artinya, RAM bisa diakses tanpa tergantung pada tata letak data. Selain itu, RAM juga merupakan sistem penyimpanan yang sifatnya sementara, tidak seperti hardisk yang merupakan penyimpanan permanen.

Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron... more

Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam

Reliability and variability have become big design challenges facing submicrometer SRAM designers. A low area overhead adaptive body bias (ABB) circuit is proposed in this paper to compensate for NBTI aging and process variations to... more

Reliability and variability have become big design challenges facing submicrometer SRAM designers. A low area overhead adaptive body bias (ABB) circuit is proposed in this paper to compensate for NBTI aging and process variations to improve the SRAM reliability and yield. The proposed ABB circuit consists of a threshold voltage sensing circuit and an on-chip analog controller. Postlayout simulation results, referring to an industrial hardware-calibrated STMicroelectronics 65 nm CMOS technology transistor model, are presented. The transistor model contains process variations and NBTI aging model cards, which are declared by STMicroelectronics to be silicon verified. Cadence RelXpert, Virtuoso Spectre, and Virtuoso UltraSim tools are used to estimate the NBTI aging and process variations impacts on the SRAM array. These results show that the proposed ABB compensates effectively for NBTI aging and process variations. For example, the proposed ABB reduces the read failure probability from 0.32% to 0.05% and the SNM degradation from 10.9% to 2.6% at 10 years aging time. In addition, the proposed ABB enhances the soft errors immunity of the SRAM cell by reducing the critical charge degradation from 12.7% to 3.4% at 10 years aging time.

Smart grid (SG) communication has recently received significant attentions to facilitate intelligent and distributed electric power transmission systems. However, communication trust and security issues still present practical concerns to... more

Smart grid (SG) communication has recently received significant attentions to facilitate intelligent and distributed electric power transmission systems. However, communication trust and security issues still present practical concerns to the deployment of SG. In this paper, to cope with these challenging concerns, we propose a lightweight message authentication scheme features as a basic yet crucial component for secure SG communication framework. Specifically, in the proposed scheme, the smart meters which are distributed at different hierarchical networks of the SG can first achieve mutual authentication and establish the shared session key with Diffie-Hellman exchange protocol. Then, with the shared session key between smart meters and hash-based authentication code technique, the subsequent messages can be authenticated in a lightweight way. Detailed security analysis shows that the proposed scheme can satisfy the desirable security requirements of SG communications. In addition, extensive simulations have also been conducted to demonstrate the effectiveness of the proposed scheme in terms of low latency and few signal message exchanges.

In this paper, all linked and unlinked static and two-operation dynamic faults are considered. A classification for their description is introduced. To generate a test algorithm for detection of all the considered faults, it was shown... more

In this paper, all linked and unlinked static and two-operation dynamic faults are considered. A classification for their description is introduced. To generate a test algorithm for detection of all the considered faults, it was shown that it is not an easy problem. For this purpose, a new structure-oriented method is developed. Based on the proposed method, an efficient test algorithm March LSD of complexity 75N is generated for the detection of the considered linked static and dynamic faults.