Atom Probe Microscopy (original) (raw)

Overview

Authors:

• Michael P. Moody 1,
• Julie M. Cairney 2,
• …
• Simon P. Ringer 3

1. Baptiste Gault
   1. , Dept of Materials Science & Engineering, McMaster University, Hamilton, Canada
2. Michael P. Moody
   1. , Department of Materials, University of Oxford, Oxford, United Kingdom
3. Julie M. Cairney
   1. , Australian Centre for Microscopy and Mic, The University of Sydney, Sydney, Australia
4. Simon P. Ringer
   1. , Australian Centre for Microscopy and, University of Sydney, Sydney, Australia

• Provides the most practical, up-to-date and critical review of atom probe microscopy techniques

• Presents a detailed description of the analysis tools

• Includes practical examples of how the technique can be used in materials science research

• Stands as a must-have reference for any user of atom probe microscopy

• Includes supplementary material: sn.pub/extras

• 36k Accesses

• 1029 Citations

• 3 Altmetric

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About this book

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

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Table of contents (10 chapters)

1. Fundamentals

   1. Introduction

      • Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
        Pages 3-7

2. Practical Aspects

3. Practical aspects

   1. Specimen Preparation

      • Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
        Pages 71-110

4. Applying Atom Probe Techniques for Materials Science

5. Applying atom probe techniques for materials science

   1. Appendices

      • Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
        Pages 313-385

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Reviews

“Atom Probe Microscopy … provides a much needed update on the topic and introduces the broader scientific community to this developing technique. … this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory.” (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)

Authors and Affiliations

• , Dept of Materials Science & Engineering, McMaster University, Hamilton, Canada

Baptiste Gault

• , Department of Materials, University of Oxford, Oxford, United Kingdom

Michael P. Moody

• , Australian Centre for Microscopy and Mic, The University of Sydney, Sydney, Australia

Julie M. Cairney

• , Australian Centre for Microscopy and, University of Sydney, Sydney, Australia

Simon P. Ringer

Bibliographic Information

• Book Title: Atom Probe Microscopy
• Authors: Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
• Series Title: Springer Series in Materials Science
• DOI: https://doi.org/10.1007/978-1-4614-3436-8
• Publisher: Springer New York, NY
• eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
• Copyright Information: Springer Science+Business Media, LLC 2012
• Hardcover ISBN: 978-1-4614-3435-1Published: 14 May 2012
• Softcover ISBN: 978-1-4899-8939-0Published: 11 June 2014
• eBook ISBN: 978-1-4614-3436-8Published: 27 August 2012
• Series ISSN: 0933-033X
• Series E-ISSN: 2196-2812
• Edition Number: 1
• Number of Pages: XXIV, 396
• Topics: Characterization and Evaluation of Materials, Nanoscale Science and Technology, Nanochemistry, Spectroscopy and Microscopy, Nanotechnology

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