Simulation and modeling of novel electronic device architectures with NESS (Nano-Electronic Simulation Software): a modular nano TCAD simulation framework (original) (raw)
Medina-Bailon, Cristina, Dutta, Tapas ORCID: https://orcid.org/0000-0003-1917-314X, Rezaei, Ali
ORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel
ORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P.
ORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen
ORCID: https://orcid.org/0000-0002-9567-6366(2021) Simulation and modeling of novel electronic device architectures with NESS (Nano-Electronic Simulation Software): a modular nano TCAD simulation framework.Micromachines, 12(6), 680. (doi: 10.3390/mi12060680)
Abstract
The modeling of nano-electronic devices is a cost-effective approach for optimizing the semiconductor device performance and for guiding the fabrication technology. In this paper, we present the capabilities of the new flexible multi-scale nano TCAD simulation software called Nano-Electronic Simulation Software (NESS). NESS is designed to study the charge transport in contemporary and novel ultra-scaled semiconductor devices. In order to simulate the charge transport in such ultra-scaled devices with complex architectures and design, we have developed numerous simulation modules based on various simulation approaches. Currently, NESS contains a drift-diffusion, Kubo–Greenwood, and non-equilibrium Green’s function (NEGF) modules. All modules are numerical solvers which are implemented in the C++ programming language, and all of them are linked and solved self-consistently with the Poisson equation. Here, we have deployed some of those modules to showcase the capabilities of NESS to simulate advanced nano-scale semiconductor devices. The devices simulated in this paper are chosen to represent the current state-of-the-art and future technologies where quantum mechanical effects play an important role. Our examples include ultra-scaled nanowire transistors, tunnel transistors, resonant tunneling diodes, and negative capacitance transistors. Our results show that NESS is a robust, fast, and reliable simulation platform which can accurately predict and describe the underlying physics in novel ultra-scaled electronic devices.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Dutta, Dr Tapas and Nagy, Dr Daniel and Georgiev, Professor Vihar and Rezaei, Dr Ali and Adamu-Lema, Dr Fikru and Asenov, Professor Asen and Medina Bailon, Miss Cristina |
| Authors: | Medina-Bailon, C., Dutta, T., Rezaei, A., Nagy, D., Adamu-Lema, F., Georgiev, V. P., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Micromachines |
| Publisher: | MDPI |
| ISSN: | 2072-666X |
| ISSN (Online): | 2072-666X |
| Published Online: | 10 June 2021 |
| Copyright Holders: | Copyright © 2021 The Authors |
| First Published: | First published in Micromachines 12(6): 680 |
| Publisher Policy: | Reproduced under a Creative Commons License |
University Staff: Request a correction | Enlighten Editors: Update this record
Funder and Project Information
SUPERAID7
Asen Asenov
Asenov, Professor Asen
ENG - Electronics & Nanoscale Engineering
Quantum Simulator for Entangled Electronics (QSEE)
Vihar Georgiev
EP/S001131/1
ENG - Electronics & Nanoscale Engineering
Quantum Electronics Device Modelling (QUANTDEVMOD)
Vihar Georgiev
EP/P009972/1
ENG - Electronics & Nanoscale Engineering
Electrochemically-enabled high-throughput peptidomics for next-generation precision medicine
Vihar Georgiev
862539
ENG - Electronics & Nanoscale Engineering
Deposit and Record Details
| ID Code: | 243934 |
|---|---|
| Depositing User: | Miss Valerie McCutcheon |
| Datestamp: | 11 Jun 2021 12:19 |
| Last Modified: | 17 Apr 2025 14:35 |
| Date of acceptance: | 4 June 2021 |
| Date of first online publication: | 10 June 2021 |
| Date Deposited: | 11 June 2021 |
| Data Availability Statement: | Yes |